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WED2ZLRSP01S50BC 参数 Datasheet PDF下载

WED2ZLRSP01S50BC图片预览
型号: WED2ZLRSP01S50BC
PDF下载: 下载PDF文件 查看货源
内容描述: 512K ×32 / 256K ×32双阵列同步管道突发式SRAM NBL [512K x 32/256K x 32 Dual Array Synchronous Pipeline Burst NBL SRAM]
分类和应用: 静态存储器
文件页数/大小: 13 页 / 350 K
品牌: WEDC [ WHITE ELECTRONIC DESIGNS CORPORATION ]
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WED2ZLRSP01S  
White Electronic Designs  
AC CHARACTERISTICS  
166MHz  
150MHz  
133MHz  
100MHz  
Units  
Parameter  
Symbol  
Min  
Max  
Min  
Max  
Min  
Max  
Min  
Max  
Clock Time  
Clock Access Time  
tCYC  
tCD  
tOE  
tLZC  
tOH  
tLZOE  
tHZOE  
tHZC  
tCH  
tCL  
tAS  
tCES  
tDS  
tWS  
tADVS  
tCSS  
tAH  
tCEH  
tDH  
tWH  
tADVH  
tCSH  
6.0  
1.5  
1.5  
0.0  
6.7  
1.5  
1.5  
0.0  
7.5  
1.5  
1.5  
0.0  
10.0  
1.5  
1.5  
0.0  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
3.5  
3.5  
3.0  
3.0  
3.8  
3.8  
3.0  
3.0  
4.2  
4.2  
3.5  
3.5  
5.0  
5.0  
3.5  
3.5  
Output enable to Data Valid  
Clock High to Output Low-Z  
Output Hold from Clock High  
Output Enable Low to output Low-Z  
Output Enable High to Output High-Z  
Clock High to Output High-Z  
Clock High Pulse Width  
2.2  
2.2  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
0.5  
0.5  
0.5  
0.5  
0.5  
0.5  
2.5  
2.5  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
0.5  
0.5  
0.5  
0.5  
0.5  
0.5  
3.0  
3.0  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
0.5  
0.5  
0.5  
0.5  
0.5  
0.5  
3.0  
3.0  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
0.5  
0.5  
0.5  
0.5  
0.5  
0.5  
Clock Low Pulse Width  
Address Setup to Clock High  
CKE# Setup to Clock High  
Data Setup to Clock High  
Write Setup to Clock High  
Address Advance to Clock High  
Chip Select Setup to Clock High  
Address Hold to Clock high  
CKE# Hold to Clock High  
Data Hold to Clock High  
Write Hold to Clock High  
Address Advance to Clock High  
Chip Select Hold to Clock High  
NOTES:  
1. All Address inputs must meet the specified setup and hold times for all rising clock (CK) edges when ADV is sampled low and CEx# is  
sampled valid. All other synchronous inputs must meet the specified setup and hold times whenever this device is chip selected.  
2. Chip enable must be valid at each rising edge of CK (when ADV is Low) to remain enabled.  
3. A write cycle is defined by WE# low having been registered into the device at ADV Low. A Read cycle is defined by WE# High with ADV Low.  
Both cases must meet setup and hold times.  
4. Applies to each of the independent arrays.  
AC TEST CONDITIONS  
(0 ≤ TA ≤ 70°C, VCC = 2.5V 5ꢀ, Unless Otherwise Specified)  
Parameter  
Input Pulse Level  
Value  
0 to 2.5V  
Input Rise and Fall Time (Measured at 20ꢀ to 80ꢀ)  
Input and Output Timing Reference Levels  
Output Load  
1.0V/ns  
1.25V  
See Output Load (A)  
OUTPUT LOAD (A)  
OUTPUT LOAD (B)  
(for tLZC, tLZOE, tHZOE, and tHZC  
)
Dout  
RL=50  
VL=1.25V  
+2.5V  
30pF*  
Zo=50Ω  
1667  
Dout  
1538Ω  
5pF*  
*Including Scope and Jig Capacitance  
White Electronic Designs Corp. reserves the right to change products or specifications without notice.  
April, 2002  
Rev. 0  
6
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com