uP0114
Electrical Characteristics
Parameter
Symbol Test Conditions
Min
Typ Max Units
FON#/ EN
FON#/ EN Voltage High
FON#/ EN Voltage Low
FON#/ EN Bias Current
Over Temperature Protection
OTP Threshold Level
OTP Hysteresis
1.6
--
--
--
1
--
V
V
0.4
10
FON#/EN = 0V
--
uA
--
--
160
25
--
--
OC
OC
RUG_SNK IUG = 100mA sinking
Note 1. Stresses listed as the above “Absolute Maximum Ratings” may cause permanent damage to the device.
These are for stress ratings. Functional operation of the device at these or any other conditions beyond those
indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating
conditions for extended periods may remain possibility to affect device reliability.
Note 2. Devices are ESD sensitive. Handling precaution recommended.
Note 3. θJA is measured in the natural convection at TA = 25°C on a low effective thermal conductivity test board of
JEDEC 51-3 thermal measurement standard.
uPI Semiconductor Corp., http://www.upi-semi.com
Rev. P00, File Name: uP0114-DS-P0000
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