TLP250H,TLP250HF
13. Test Circuits and Characteristics Curves
13.1. Test Circuits
Fig. 13.1.1 IOPH Test Circuit
Fig. 13.1.3 VOH Test Circuit
Fig. 13.1.5 ICCH Test Circuit
Fig. 13.1.2 IOPL Test Circuit
Fig. 13.1.4 VOL Test Circuit
Fig. 13.1.6 ICCL Test Circuit
Fig. 13.1.7 Switching Time Test Circuit and Waveform
Fig. 13.1.8 Common-Mode Transient Immunity Test Circuit and Waveform
©2015 Toshiba Corporation
2015-12-24
Rev.4.0
8