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TPS74801-Q1 参数 Datasheet PDF下载

TPS74801-Q1图片预览
型号: TPS74801-Q1
PDF下载: 下载PDF文件 查看货源
内容描述: 1.5低压差线性稳压器,具有可编程软启动 [1.5 A Low-Dropout Linear Regulator with Programmable Soft-Start]
分类和应用: 稳压器软启动
文件页数/大小: 22 页 / 734 K
品牌: TI [ TEXAS INSTRUMENTS ]
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TPS74801-Q1  
SLVSAI4A OCTOBER 2010REVISED FEBRUARY 2011  
www.ti.com  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with  
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more  
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.  
ORDERING INFORMATION(1)  
TA  
PACKAGE(2)  
ORDERABLE PART NUMBER  
TOP-SIDE MARKING  
QVK  
40°C to 105°C  
SON DRC  
Reel of 3000  
TPS74801TDRCRQ1  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
website at www.ti.com.  
(2) Package drawings, thermal data, and symbolization are available at www.ti.com//packaging.  
ABSOLUTE MAXIMUM RATINGS(1)  
At TA = 40°C to +105°C, unless otherwise noted. All voltages are with respect to GND.  
TPS74801-Q1  
0.3 to +6  
UNIT  
V
VIN, VBIAS Input voltage range  
VEN  
VPG  
IPG  
Enable voltage range  
0.3 to +6  
V
Power good voltage range  
PG sink current  
0.3 to +6  
V
0 to +1.5  
mA  
V
VSS  
VFB  
VOUT  
IOUT  
Soft-start voltage range  
0.3 to +6  
Feedback voltage range  
Output voltage range  
0.3 to +6  
V
0.3 to VIN + 0.3  
V
Maximum output current  
Output short-circuit duration  
Continuous total power dissipation  
Operating junction temperature range  
Storage junction temperature range  
Internally limited  
Indefinite  
PDISS  
TJ  
See Thermal Information Table  
40 to +125  
55 to +150  
°C  
°C  
TSTG  
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings  
only and functional operation of the device at these conditions is not implied. Exposure to absolute-maximum-rated conditions for  
extended periods may affect device reliability.  
2
Submit Documentation Feedback  
© 20102011, Texas Instruments Incorporated  
Product Folder Link(s): TPS74801-Q1  
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