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BQ4014Y 参数 Datasheet PDF下载

BQ4014Y图片预览
型号: BQ4014Y
PDF下载: 下载PDF文件 查看货源
内容描述: 256Kx8非易失SRAM\n [256Kx8 Nonvolatile SRAM ]
分类和应用: 静态存储器
文件页数/大小: 11 页 / 765 K
品牌: TI [ TEXAS INSTRUMENTS ]
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bq4014/bq4014Y  
As VCC falls past VPFD and approaches 3V, the control  
circuitry switches to the internal lithium backup supply,  
which provides data retention until valid VCC is applied.  
Functional Description  
When power is valid, the bq4014 operates as a standard  
CMOS SRAM. During power-down and power-up cycles,  
the bq4014 acts as a nonvolatile memory, automatically  
protecting and preserving the memory contents.  
When VCC returns to a level above the internal backup  
cell voltage, the supply is switched back to VCC  
. After  
VCC ramps above the VPFD threshold, write-protection  
continues for a time tCER (120ms maximum) to allow for  
processor stabilization. Normal memory operation may  
resume after this time.  
P ower -down /power -u p con t r ol cir cu it r y con sta n tly  
monitors the VCC supply for a power-fail-detect threshold  
VPFD. The bq4014 monitors for VPFD = 4.62V typical for  
use in systems with 5% supply tolerance. The bq4014Y  
monitors for VPFD = 4.37V typical for use in systems with  
10% supply tolerance.  
The internal coin cells used by the bq4014 have an  
extremely long shelf life and provide data retention for  
more than 10 years in the absence of system power.  
When VCC falls below the VPFD threshold, the SRAM  
a utom a tica lly wr ite-pr otects the data . All outputs  
become high impedance, and all inputs are treated as  
dont care.” If a valid access is in process at the time of  
power-fail detection, the memory cycle continues to com-  
pletion. If the memory cycle fails to terminate within  
time tWPT, write-protection takes place.  
As shipped from Benchmarq, the integral lithium cells  
are electrically isolated from the memory. (Self-discharge  
in t his con dition is a ppr oxim ately 0.5% per yea r .)  
Following the first application of VCC, this isolation is  
broken, and the lithium backup provides data retention  
on subsequent power-downs.  
Truth Table  
Mode  
Not selected  
CE  
H
L
WE  
X
OE  
X
I/O Operation  
High Z  
High Z  
DOUT  
Power  
Standby  
Active  
Output disable  
Read  
H
H
L
H
L
Active  
Write  
L
L
X
DIN  
Active  
Absolute Maximum Ratings  
Symbol  
Parameter  
Value  
Unit  
Conditions  
VCC  
DC voltage applied on VCC relative to VSS  
-0.3 to 7.0  
V
DC voltage applied on any pin excluding VCC  
relative to VSS  
VT  
-0.3 to 7.0  
V
VT VCC + 0.3  
TOPR  
TSTG  
TBIAS  
Operating temperature  
Storage temperature  
Temperature under bias  
0 to +70  
-40 to +70  
-10 to +70  
+260  
°C  
°C  
°C  
°C  
TSOLDER Soldering temperature  
For 10 seconds  
Note:  
Permanent device damage may occur if Absolu te Ma xim u m Ratin gs are exceeded. Functional operation  
should be limited to the Recommended DC Operating Conditions detailed in this data sheet. Exposure to  
conditions beyond the operational limits for extended periods of time may affect device reliability.  
Sept. 1992  
2
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