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ADS1292 参数 Datasheet PDF下载

ADS1292图片预览
型号: ADS1292
PDF下载: 下载PDF文件 查看货源
内容描述: 低功耗,双通道, 24位模拟前端的生物电位测量 [Low-Power, 2-Channel, 24-Bit Analog Front-End for Biopotential Measurements]
分类和应用:
文件页数/大小: 69 页 / 1524 K
品牌: TI [ TEXAS INSTRUMENTS ]
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ADS1291  
ADS1292  
ADS1292R  
SBAS502A DECEMBER 2011REVISED MARCH 2012  
www.ti.com  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with  
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more  
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.  
FAMILY AND ORDERING INFORMATION(1)  
MAXIMUM  
SAMPLE  
RESOLUTION RATE (kSPS)  
OPERATING  
TEMPERATUR RESPIRATION  
E RANGE  
PACKAGE  
OPTION  
PACKAGE  
DESIGNATOR  
NUMBER OF  
CHANNELS  
ADC  
PRODUCT  
CIRCUITRY  
TQFP  
QFN  
PBS  
RSM  
PBS  
RSM  
PBS  
RSM  
1
1
2
2
2
2
24  
24  
24  
24  
24  
24  
8
8
8
8
8
8
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
No  
No  
ADS1291I  
TQFP  
QFN  
No  
ADS1292I  
No  
TQFP  
QFN  
Yes  
Yes  
ADS1292RI  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the  
device product folder at www.ti.com.  
ABSOLUTE MAXIMUM RATINGS(1)  
Over operating free-air temperature range, unless otherwise noted.  
ADS1291, ADS1292, ADS1292R  
UNIT  
V
AVDD to AVSS  
–0.3 to +5.5  
DVDD to DGND  
–0.3 to +3.9  
V
AGND to DGND  
–0.3 to +0.3  
V
Analog input to AVSS  
Digital input to DVDD  
Input current to any pin except supply pins  
AVSS – 0.3 to AVDD + 0.3  
V
DVSS – 0.3 to DVDD + 0.3  
V
±10  
±100  
mA  
mA  
mA  
°C  
°C  
°C  
Momentary  
Input current  
Continuous  
±10  
Operating temperature range  
Storage temperature range  
Maximum junction temperature (TJ)  
Human body model (HBM)  
–40 to +85  
–60 to +150  
+150  
±1000  
±500  
V
V
JEDEC standard 22, test method A114-C.01, all pins  
ESD ratings  
Charged device model (CDM)  
JEDEC standard 22, test method C101, all pins  
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may  
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond  
those specified is not implied.  
2
Submit Documentation Feedback  
Copyright © 2011–2012, Texas Instruments Incorporated  
Product Folder Link(s): ADS1291 ADS1292 ADS1292R  
 
 
 
 
 
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