TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions
+125 C
5.5 V
Group A
subgroups
Device
types
Limits
Max
Unit
-55 C
T
C
= 0 V; 4.5 V
V
V
V
CC
Min
SS
unless otherwise specified
High level input
current
I
= 5.5 V, V = 5.5 V
1, 2, 3
All
10
2/
A
IH
CC
IN
M,D,P
1 1/
Low level input current
I
V
= 5.5 V, V = 0.0 V
IN
1, 2, 3
All
All
-10
2/
A
A
IL
CC
CC
M,D,P
1 1/
High impedance output
leakage current
I
V
V
= 5.5 V, V = 5.5 V
O
1, 2, 3
10
2/
OZH
= 0.0 V, V = 5.0 V
IL
IH
V
OE
V
CC
IH
M,D,P
= 5.5 V, V = 0.0 V
1 1/
I
V
V
1, 2, 3
All
-10
OZL
CC
IL
O
= 0.0 V, V = 5.0 V
IH
V
IH
OE
V
CC
M,D,P
= 4.5 V
1 1/
2/
Output high voltage
V
OH
I
V
= -4.0 mA, V
CC
1, 2, 3
01-
41,47
2.4
V
OH
IH
= 2.2 V, V = 0.8 V
IL
M,D,P
= 4.5 V
1 1/
2/
I
= -1.0 mA, V
CC
42- 46
2.4
OH
V
= 2.2 V, V = 0.8 V
IH
IL
M,D,P
1 1/
2/
Output low voltage
V
OL
I
V
= 8.0 mA, V
= 4.5 V
1, 2, 3
01-
41,47
0.4
V
OL
IH
CC
= 2.2 V, V = 0.8 V
IL
M,D,P
1 1/
2/
I
V
= 2.1 mA, V
= 4.5 V
42- 46
0.4
OL
IH
CC
= 2.2 V, V = 0.8 V
IL
M,D,P
1 1/
2/
See footnotes at end of table.
SIZE
STANDARD
5962-89598
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
L
SHEET
7
DSCC FORM 2234
APR 97
TEMIC [ TEMIC SEMICONDUCTORS ]
