TABLE IIA. Electrical test requirements. 1/ 2/ 3/ 4/ 5/ 6/ 7/
Line
no.
Test requirements
Subgroups
(in accordance with
MIL-STD-883,
Subgroups
(in accordance with
MIL-PRF-38535, table III)
TM 5005, table I)
Device
class M
Device
class Q
Device
class V
1
2
Interim electrical
1, 7, 9
parameters (see 4.2)
Static burn-in
(method 1015)
Not
required
Not
required
Required
3
4
Same as line 1
1*, 7*
Dynamic burn-in
(method 1015)
Required
Required
Required
5
6
Same as line 1
1*, 7*
Final electrical
parameters (see 4.2)
1*, 2, 3, 7*, 8A,
8B, 9, 10, 11
1*, 2, 3, 7*, 8A,
8B, 9, 10, 11
1*, 2, 3, 7*, 8A,
8B, 9, 10, 11
7
8
Group A test
1, 2, 3, 4**, 7,
1, 2, 3, 4**, 7,
1, 2, 3, 4**, 7,
requirements (see 4.4)
8A, 8B, 9, 10, 11
8A, 8B, 9, 10, 11
8A, 8B, 9, 10, 11
Group C end-point
electrical
parameters (see 4.4)
2, 3, 7,
8A, 8B
1, 2, 3, 7,
8A, 8B
1, 2, 3, 7, 8A,
8B, 9, 10, 11
9
Group D end-point
electrical
2, 3, 8A, 8B
1, 7, 9
2, 3, 8A, 8B
1, 7, 9
2, 3, 8A, 8B
1, 7, 9
parameters (see 4.4)
10
Group E end-point
electrical
parameters (see 4.4)
1/ Blank spaces indicate tests are not applicable.
2/ Any or all subgroups may be combined when using high-speed testers.
3/ Subgroups 7 and 8 functional tests shall verify the truth table.
4/ * indicates PDA applies to subgroup 1 and 7.
5/ ** see 4.4.1e.
6/ indicates delta limit (see table IIB) shall be required where specified, and the delta values shall be
computed with reference to the previous interim electrical parameters (see line 1).
7/ See 4.4.1d.
TABLE IIB. Delta limits at +25 C.
Parameter 1/
Device types
All
10% of specified
value in table I
I
I
I
standby
CC3
10% of specified
value in table I
, I
IH IL
10% of specified
value in table I
, I
OHZ OLZ
1/ The above parameter shall be recorded before and after
the required burn-in and life tests to determine the delta
.
SIZE
STANDARD
5962-89598
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
L
SHEET
38
DSCC FORM 2234
APR 97
TEMIC [ TEMIC SEMICONDUCTORS ]
