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STM32F103RC 参数 Datasheet PDF下载

STM32F103RC图片预览
型号: STM32F103RC
PDF下载: 下载PDF文件 查看货源
内容描述: 基于ARM的高性能线的32位MCU,具有高达512 KB的闪存, USB , CAN ,11个定时器,3个ADC和13通信接口 [Performance line, ARM-based 32-bit MCU with up to 512 KB Flash, USB, CAN, 11 timers, 3 ADCs and 13 communication interfaces]
分类和应用: 闪存通信
文件页数/大小: 118 页 / 1231 K
品牌: STMICROELECTRONICS [ ST ]
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STM32F103xC, STM32F103xD, STM32F103xE  
Table 61. DAC characteristics (continued)  
Electrical characteristics  
Comments  
Symbol  
Parameter  
Min Typ  
Max(1)  
Unit  
Amplifier  
gain  
Gain of the amplifier in open  
loop  
80  
85  
dB with a 5 kΩ load (worst case)  
Settling time (full scale: for an  
10-bit input code transition  
between the lowest and the  
highest input codes when  
DAC_OUT reaches final value  
1LSB  
CLOAD 50 pF,  
µs  
tSETTLING  
3
4
1
RLOAD 5 kΩ  
Max frequency for a correct  
DAC_OUT change when small  
variation in the input code (from  
code i to i+1LSB)  
Update  
rate  
CLOAD 50 pF,  
MS/s  
RLOAD 5 kΩ  
CLOAD 50 pF,  
RLOAD 5 kΩ  
input code between lowest and  
Wakeup time from off state  
(PDV18 from 1 to 0)  
tWAKEUP  
6.5  
10  
µs  
highest possible ones.  
Power supply rejection ratio (to  
VDD33A) (static DC  
PSRR+  
–67  
–40  
dB No RLOAD, CLOAD = 50 pF  
measurement  
1. Guaranteed by characterization, not tested in production.  
5.3.20  
Temperature sensor characteristics  
Table 62. TS characteristics  
Symbol Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
(1)  
TL  
VSENSE linearity with temperature  
°C  
1
4.3  
2
4.6  
1.52  
10  
Avg_Slope(1)  
Average slope  
Voltage at 25 °C  
Startup time  
4.0  
1.34  
4
mV/°C  
V
(1)  
V25  
1.43  
(2)  
tSTART  
µs  
ADC sampling time when reading the  
temperature  
(3)(2)  
TS_temp  
2.2  
17.1  
µs  
1. Guaranteed by characterization, not tested in production.  
2. Data guaranteed by design, not tested in production.  
3. Shortest sampling time can be determined in the application by multiple iterations.  
105/118  
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