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SST89E516RD2-40-C-NJE 参数 Datasheet PDF下载

SST89E516RD2-40-C-NJE图片预览
型号: SST89E516RD2-40-C-NJE
PDF下载: 下载PDF文件 查看货源
内容描述: FlashFlex MCU [FlashFlex MCU]
分类和应用: 外围集成电路微控制器PC时钟
文件页数/大小: 81 页 / 832 K
品牌: SST [ SILICON STORAGE TECHNOLOGY, INC ]
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FlashFlex MCU  
SST89E516RD2 / SST89E516RD  
SST89V516RD2 / SST89V516RD  
Data Sheet  
2. Capacitive loading on Ports 0 and 2 may cause spurious noise to be superimposed on the VOLs of ALE and Ports 1 & 3. The noise  
due to external bus capacitance discharging into the Port 0 & 2 pins when the pins make 1-to-0 transitions during bus operations. In  
the worst cases (capacitive loading > 100pF), the noise pulse on the ALE pin may exceed 0.8V. In such cases, it may be desirable to  
qualify ALE with a Schmitt Trigger, or use an address latch with a Schmitt Trigger STROBE input.  
3. Load capacitance for Port 0, ALE & PSEN#= 100pF, load capacitance for all other outputs = 80pF.  
4. Capacitive loading on Ports 0 and 2 may cause the VOH on ALE and PSEN# to momentarily fall below the VDD - 0.7 specification  
when the address bits are stabilizing.  
5. Pins of Ports 1, 2, and 3 source a transition current when they are being externally driven from 1 to 0. The transition current reaches  
its maximum value when VIN is approximately 2V.  
6. Pin capacitance is characterized but not tested. EA# is 25pF (max).  
©2007 Silicon Storage Technology, Inc.  
S71273-03-000  
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