2 Megabit Multi-Purpose Flash
SST39SF020
Preliminary Specifications
V
IHT
1
V
V
HT
HT
INPUT
REFERENCE POINTS
OUTPUT
V
V
LT
LT
2
V
ILT
326 ILL F11.1
3
AC test inputs are driven at VIHT (2.4 V) for a logic “1” and VILT (0.4 V) for a logic “0”. Measurement reference points
for inputs and outputs are VHT (2.0 V) and VLT (0.8 V). Inputs rise and fall times (10% ↔ 90%) are <10 ns.
4
Note: VHT–VHIGH Test
VLT–VLOW Test
VIHT–VINPUT HIGH Test
VILT–VINPUT LOW Test
5
FIGURE 12: AC INPUT/OUTPUT REFERENCE WAVEFORMS
6
7
TEST LOAD EXAMPLE
8
V
CC
TO TESTER
9
R
L HIGH
10
11
12
13
14
15
16
TO DUT
C
L
R
L LOW
326 ILL F12.1
FIGURE 13: A TEST LOAD EXAMPLE
© 1998 Silicon Storage Technology, Inc.
326-10 12/98
15
SST [ SILICON STORAGE TECHNOLOGY, INC ]
