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S29CD032G 参数 Datasheet PDF下载

S29CD032G图片预览
型号: S29CD032G
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内容描述: CMOS 2.5伏只突发模式下的双启动,同步读/写FLASH MEMORY [CMOS 2.5 VOLT ONLY BURST MODE DUAL BOOT, SIMULTANEOUS READ /WRITE FLASH MEMORY]
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文件页数/大小: 93 页 / 1616 K
品牌: SPANSION [ SPANSION ]
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A d v a n c e I n f o r m a t i o n  
mand ......................................................................................................... 57  
SecSi Sector Protection Bit Program Command ........................ 57  
PPB Lock Bit Set Command .............................................................. 57  
DYB Write Command ........................................................................ 57  
Password Unlock Command .............................................................58  
PPB Program Command .....................................................................58  
All PPB Erase Command .................................................................... 59  
DYB Write .............................................................................................. 59  
PPB Lock Bit Set .................................................................................... 59  
DYB Status .............................................................................................. 59  
PPB Status ............................................................................................... 59  
PPB Lock Bit Status .............................................................................. 59  
Non-volatile Protection Bit Program And Erase Flow ............. 59  
Table 19. Memory Array Command Definitions (x32 Mode) .....61  
Table 20. Sector Protection Command Definitions (x32 Mode) .62  
DQ7: Data# Polling .............................................................................. 63  
Figure 6. Data# Polling Algorithm ....................................... 64  
RY/BY#: Ready/Busy# ......................................................................... 65  
DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 70  
Figure 10. ICC1 Current vs. Time (Showing Active and Automatic  
Sleep Currents)................................................................ 71  
Figure 11. Typical ICC1 vs. Frequency.................................. 71  
Test Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . 72  
Figure 12. Test Setup ....................................................... 72  
Table 22. Test Specifications .............................................. 72  
Key to Switching Waveforms . . . . . . . . . . . . . . . . 72  
Figure 13. Input Waveforms and Measurement Levels........... 72  
AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 73  
Figure 14. VCC and VIO Power-up Diagram........................... 73  
Figure 15. Conventional Read Operations Timings................. 74  
Figure 16. Burst Mode Read (x32 Mode).............................. 76  
Figure 17. Asynchronous Command Write Timing ................. 77  
Figure 18. Synchronous Command Write/Read Timing........... 77  
Figure 19. RESET# Timings ............................................... 78  
Figure 20. WP# Timing ..................................................... 79  
Figure 21. Program Operation Timings ................................ 81  
Figure 22. Chip/Sector Erase Operation Timings................... 82  
Figure 23. Back-to-back Cycle Timings................................ 82  
Figure 24. Data# Polling Timings  
DQ6: Toggle Bit I .................................................................................. 65  
DQ2: Toggle Bit II ................................................................................66  
(During Embedded Algorithms) .......................................... 83  
Figure 25. Toggle Bit Timings  
Reading Toggle Bits DQ6/DQ2 ........................................................66  
Figure 7. Toggle Bit Algorithm ............................................ 67  
DQ5: Exceeded Timing Limits ..........................................................68  
DQ3: Sector Erase Timer ..................................................................68  
Table 21. Write Operation Status ........................................68  
(During Embedded Algorithms) .......................................... 83  
Figure 26. DQ2 vs. DQ6 for Erase/Erase Suspend Operations . 84  
Figure 27. Synchronous Data Polling Timing/Toggle Bit Timings 84  
Figure 28. Sector Protect/Unprotect Timing Diagram............. 85  
Figure 29. Alternate CE# Controlled Write Operation Timings. 87  
Erase and Programming Performance . . . . . . . . 88  
Latchup Characteristics. . . . . . . . . . . . . . . . . . . . 88  
PQFP and Fortified BGA Pin Capacitance. . . . . 88  
Physical Dimensions . . . . . . . . . . . . . . . . . . . . . . . 89  
Revision Summary . . . . . . . . . . . . . . . . . . . . . . . . . .91  
Absolute Maximum Ratings . . . . . . . . . . . . . . . . . .69  
Figure 8. Maximum Negative Overshoot Waveform................ 69  
Figure 9. Maximum Positive Overshoot Waveform ................. 69  
Industrial (I) Devices ......................................................................................................69  
Extended (E) Devices ....................................................................................................69  
VCC Supply Voltages ......................................................................................................69  
VIO Supply Voltages .......................................................................................................69  
March 22, 2004 30606B0  
S29CD032G  
5
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