A d v a n c e I n f o r m a t i o n
Test Conditions
3.3 V
2.7 kΩ
Device
Under
Test
C
6.2 kΩ
L
Note: Diodes are IN3064 or equivalent
Figure 12. Tes t Se tup
Table 19. Test Specifications
Speed Option
Output Load
70
90
Unit
1 TTL gate
Output Load Capacitance, CL
(including jig capacitance)
30
100
5
pF
Input Rise and Fall Times
Input Pulse Levels
ns
V
0.0 or VCC
Input timing measurement
reference levels
0.5 VCC
0.5 VCC
V
V
Output timing measurement
reference levels
48
S29AL032D
S29AL032D_00_A3 June 13, 2005