MBM29DL32XTE/BE80/90
■ ERASE AND PROGRAMMING PERFORMANCE
Limit
Parameter
Unit
Comments
Min
Typ
Max
Excludes programming time
prior to erasure
Sector Erase Time
1
10
s
Word Programming Time
Byte Programming Time
16
8
360
300
µs
µs
Excludes system-level
overhead
Excludes system-level
overhead
Chip Programming Time
Program/Erase Cycle
100
s
100,000
cycle
■ PIN CAPACITANCE
Parameter
Input Capacitance
Symbol
Test setup
Typ
6.0
Max
7.5
Unit
pF
CIN
COUT
CIN2
CIN3
VIN = 0
Output Capacitance
Control Pin Capacitance
WP/ACC Pin Capacitance
VOUT = 0
VIN = 0
VIN = 0
8.5
12.0
11.0
22.5
pF
8.0
pF
21.5
pF
Notes : • Test conditions TA = +25 °C, f = 1.0 MHz
• DQ15/A-1 pin capacitance is stipulated by output capacitance.
■ FBGA PIN CAPACITANCE
Parameter
Input Capacitance
Symbol
CIN
Condition
Typ
7.0
Max
9.0
Unit
pF
VIN = 0
Output Capacitance
COUT
CIN2
VOUT = 0
VIN = 0
VIN = 0
9.5
13.0
12.0
22.5
pF
Control Pin Capacitance
WP/ACC Pin Capacitance
9.0
pF
CIN3
21.5
pF
Notes : • Test conditions TA = +25 °C, f = 1.0 MHz
• DQ15/A-1 pin capacitance is stipulated by output capacitance.
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SPANSION [ SPANSION ]
