MBM29DL16XTE/BE70/90
2. AC Characteristics
• Read Only Operations Characteristics
Symbol
JEDEC Standard
70
90
Condi-
tions
Parameter
Unit
Min
Max
Min
Max
Read Cycle Time
tAVAV
tAVQV
tRC
—
70
90
ns
ns
CE = VIL
OE = VIL
Address to Output Delay
tACC
70
90
Chip Enable to Output Delay
Output Enable to Output Delay
Chip Enable to Output High-Z
Output Enable to Output High-Z
tELQV
tGLQV
tEHQZ
tGHQZ
tCE
tOE
tDF
tDF
OE = VIL
70
30
25
25
90
35
30
30
ns
ns
ns
ns
—
—
—
Output Hold Time From Addresses,
CE or OE, Whichever Occurs First
tAXQX
—
tOH
—
—
—
0
0
ns
µs
ns
RESET Pin Low to Read Mode
tREADY
20
5
20
5
tELFL
tELFH
CE to BYTE Switching Low or High
—
Note: Test Conditions:
Output Load: 1 TTL gate and 30 pF (MBM29DL16XTE/BE70)
1 TTL gate and 100 pF (MBM29DL16XTE/BE90)
Input rise and fall times: 5 ns
Input pulse levels: 0.0 V or 3.0 V
Timing measurement reference level
Input: 1.5 V
Output:1.5 V
3.3 V
Diode = 1N3064
or Equivalent
2.7 kΩ
Device
Under
Test
6.2 kΩ
CL
Diode = 1N3064
or Equivalent
Note : CL = 30 pF including jig capacitance (MBM29DL16XTE/BE70)
CL = 100 pF including jig capacitance (MBM29DL16XTE/BE90)
Test Conditions
47
SPANSION [ SPANSION ]
