D A T A S H E E T
AC CHARACTERISTICS
Read Operations
Speed Options and
Temperature Ranges
Parameter
65R
70R
I, E
70
90R
I, E
90
120R
I, E
JEDEC Std. Description
Test Setup
I
E
Unit
t
t
Read Cycle Time (Note 1)
Address to Output Delay
ACC
Min
65
65
65
120
ns
AVAV
RC
CE# = V
OE# = V
IL
IL
t
t
Max
Max
70
90
120
ns
AVQV
t
t
t
Chip Enable to Output Delay
Output Enable to Output Delay
OE# = V
70
24
90
26
120
26
ns
ns
ELQV
GLQV
CE
IL
t
t
Max 17
Max 17
18
18
OE
Chip Enable to Output High Z
(Note 1)
t
t
24
25
26
30
26
30
ns
EHQZ
GHQZ
DF
t
Output Enable to Output High Z (Note 1)
Max
Min
20
ns
ns
DF
Read
0
Output Enable
Hold Time (Note 1)
t
OEH
Toggle and
Data# Polling
Min
Min
10
0
ns
ns
Output Hold Time From Addresses, CE# or
OE#, Whichever Occurs First (Note 1)
t
t
OH
AXQX
Notes:
1. Not 100% tested.
2. See Figure 13 and Table 10 for test specifications
32
Am29BL162C
July 8, 2005
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