D A T A S H E E T
DC CHARACTERISTICS
CMOS Compatible
Parameter
Description
Test Conditions
IN = VSS to VCC
CC = VCC max
Min
Typ
Max
±1.0
35
Unit
µA
V
V
,
ILI
Input Load Current
ILIT
ILO
ILR
A9 Input Load Current
VCC = VCC max; A9 = 12.5 V
VOUT = VSS to VCC
CC = VCC max
VCC = VCC max, RESET# = 12.5 V
µA
,
Output Leakage Current
RESET Input Load Current
±1.0
µA
V
35
12
4
µA
5 MHz
7
2
7
2
CE# = VIL, OE# = VIH,
Byte Mode
1 MHz
5 MHz
1 MHz
VCC Active Read Current
(Note 1)
ICC1
mA
12
4
CE# = VIL, OE# = VIH,
Word Mode
VCC Active Write Current
(Notes 2, 3, 5)
ICC2
CE# = VIL, OE# = VIH
15
30
mA
ICC3
ICC4
VCC Standby Current (Note 2) CE#, RESET# = VCC±0.3 V
0.2
0.2
5
5
µA
µA
VCC Reset Current (Note 2)
RESET# = VSS ± 0.3 V
Automatic Sleep Mode
(Notes 2, 4)
ICC5
VIH = VCC 0.3 V; VIL = VSS ± 0.3 V
0.2
5
µA
VIL
VIH
Input Low Voltage
Input High Voltage
–0.5
0.8
V
V
0.7 x VCC
VCC + 0.3
Voltage for Autoselect and
Temporary Sector Unprotect
VID
V
CC = 3.3 V
11.5
12.5
0.45
V
VOL
VOH1
VOH2
Output Low Voltage
IOL = 4.0 mA, VCC = VCC min
IOH = –2.0 mA, VCC = VCC min
IOH = –100 µA, VCC = VCC min
V
V
0.85 VCC
VCC–0.4
Output High Voltage
Low VCC Lock-Out Voltage
(Note 4)
VLKO
2.3
2.5
V
Notes:
1. The ICC current listed is typically less than 2 mA/MHz, with OE# at VIH. Typical VCC is 3.0 V.
2. Maximum ICC specifications are tested with VCC = VCCmax
.
3. ICC active while Embedded Erase or Embedded Program is in progress.
4. Automatic sleep mode enables the low power mode when addresses remain stable for tACC + 30 ns.
5. Not 100% tested.
December 4, 2006 21523D4
Am29LV400B
25