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SII0680ACLU144 参数 Datasheet PDF下载

SII0680ACLU144图片预览
型号: SII0680ACLU144
PDF下载: 下载PDF文件 查看货源
内容描述: PCI转IDE / ATA [PCI to IDE/ATA]
分类和应用: PC
文件页数/大小: 124 页 / 782 K
品牌: SILICONIMAGE [ Silicon image ]
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SiI0680A PCI to IDE/ATA  
Data Sheet  
Silicon Image, Inc.  
10.4 PLL TEST  
10.4.1 BYPASSING the VCO  
The VCO in the analog phase-locked loop must be bypassed during digital logic simulation, to allow direct control of the PLL  
output clock. When PLL_CPBIAS is forced high the reference clock (PCI_CLK) is muxed to the PLL output. Automatic test  
equipment at the foundry also requires this test functionality to run the digital test vectors.  
10.4.2 TESTING the VCO  
A divide-by-4K counter is used to measure the VCO frequency for any controlled voltage at the PLL_LOOPFLT pin.  
Normal Function  
0
MEM_CS_N  
1
4K  
RST_PLL_TEST  
PCI_IDSEL  
&
&
SCAN_MODE  
BA5_EN  
&
1
PLL_TEST_CLK_SEL  
P_CLK  
33 MHz  
0
2
2
3
&
PLL_TEST_MODE  
TEST_MODE  
PCI_GNT_N  
&
( FB Clock )  
(Ref Clock)  
PLL  
PCI_CLK  
0
1
(Test Clock)  
IDE0_DMARQ  
PLL_CPBIAS  
Figure 10-4: PLL Test Logic  
© 2006 Silicon Image, Inc.  
SiI-DS-0069-C  
107  
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