Si824x
Table 4. Insulation and Safety-Related Specifications
Value
Parameter
Symbol
Test Condition
Unit
NBSOIC-16
2.5 kV
RMS
Nominal Air Gap
(Clearance)
L(1O1)
L(1O2)
4.01
4.01
mm
mm
mm
1
1
Nominal External Tracking (Creepage)
Minimum Internal Gap
(Internal Clearance)
0.011
Tracking Resistance
(Proof Tracking Index)
PTI
ED
IEC60112
f = 1 MHz
600
V
mm
0.019
Erosion Depth
Resistance
12
R
10
IO
2
(Input-Output)
Capacitance
(Input-Output)
C
1.4
4.0
pF
pF
IO
2
3
C
Input Capacitance
I
Notes:
1. The values in this table correspond to the nominal creepage and clearance values as detailed in “7. Package Outline:
16-Pin Narrow Body SOIC” . VDE certifies the clearance and creepage limits as 4.7 mm minimum for the NB SOIC-16.
UL does not impose a clearance and creepage minimum for component level certifications. CSA certifies the clearance
and creepage limits as 3.9 mm minimum for the NB SOIC 16.
2. To determine resistance and capacitance, the Si824x is converted into a 2-terminal device. Pins 1–8 are shorted
together to form the first terminal and pins 9–16 are shorted together to form the second terminal. The parameters are
then measured between these two terminals.
3. Measured from input pin to ground.
Table 5. IEC 60664-1 (VDE 0884 Part 2) Ratings
Specification
Parameter
Test Conditions
NB SOIC-16
Basic Isolation Group
Material Group
I
Rated Mains Voltages < 150 V
Rated Mains Voltages < 300 V
Rated Mains Voltages < 400 V
Rated Mains Voltages < 600 V
I-IV
I-III
I-II
I-II
RMS
RMS
RMS
RMS
Installation Classification
Rev. 0.2
9
SILICON [ SILICON ]
