BATTERY PROTECTION IC FOR 1-CELL PACK
S-8241 Series
Rev.7.6_00
(5) S-8241ADF, S-8241ADG
Table 14
Test
Test
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Condition Circuit
DELAY TIME (Ta = 25 °C)
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
tCU
⎯
⎯
⎯
⎯
⎯
0.175
21
0.25
31
16
2
0.325
41
ms
ms
ms
ms
8
8
9
9
9
1
1
1
1
1
tDL
tlOV1
tlOV2
11
21
1.4
⎯
2.6
50
Load short-circuiting detection delay time tSHORT
DELAY TIME (Ta = 40 to
85 °C) *1
10
μs
−
+
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
tCU
⎯
⎯
⎯
⎯
⎯
0.138
17
0.25
31
16
2
0.425
53
s
8
8
9
9
9
1
1
1
1
1
tDL
ms
ms
ms
tIOV1
tIOV2
9
27
1.1
⎯
3.4
73
Load short-circuiting detection delay time tSHORT
10
μs
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by
design, not tested in production.
14
Seiko Instruments Inc.
SII [ SEIKO INSTRUMENTS INC ]
