BATTERY PROTECTION IC FOR 1-CELL PACK
S-8241 Series
Rev.7.6_00
3 Detection delay time
(1) S-8241ABA, S-8241ABC, S-8241ABD, S-8241ABE, S-8241ABF, S-8241ABG, S-8241ABH,
S-8241ABI, S-8241ABK, S-8241ABL, S-8241ABQ, S-8241ABT, S-8241ABU, S-8241ABV,
S-8241ABX, S-8241ABZ, S-8241ACA, S-8241ACB, S-8241ACE, S-8241ACF, S-8241ACG,
S-8241ACH, S-8241ACL, S-8241ACO, S-8241ACP, S-8241ACQ, S-8241ACR, S-8241ACS,
S-8241ACT, S-8241ACU, S-8241ACX, S-8241ACY, S-8241ADA, S-8241ADD, S-8241ADH,
S-8241ADL, S-8241ADM, S-8241ADN, S-8241ADO, S-8241ADQ, S-8241ADT, S-8241ADV
Table 10
Test
Test
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Condition Circuit
DELAY TIME (Ta = 25 °C)
⎯
⎯
⎯
⎯
⎯
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
tCU
0.7
87.5
5.6
1.4
⎯
1.0
125
8
1.3
162.5
10.4
2.6
s
8
8
9
9
9
1
1
1
1
1
tDL
ms
ms
ms
tlOV1
tlOV2
2
Load short-circuiting detection delay time tSHORT
DELAY TIME (Ta = 40 to
85 °C) *1
10
50
μs
−
+
⎯
⎯
⎯
⎯
⎯
1
1
1
1
1
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
tCU
0.55
69
1.0
125
8
1.7
212
14
s
8
8
9
9
9
tDL
ms
ms
ms
tIOV1
tIOV2
4.4
1.1
⎯
2
3.4
73
Load short-circuiting detection delay time tSHORT
10
μs
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by
design, not tested in production.
(2) S-8241ABB, S-8241ABO, S-8241ABP, S-8241ABS, S-8241ACI, S-8241ACK, S-8241ACN,
S-8241ACZ, S-8241ADE
Table 11
Test
Test
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Condition Circuit
DELAY TIME (Ta = 25 °C)
⎯
⎯
⎯
⎯
⎯
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
tCU
87.5
21
125
31
16
2
162.5
41
ms
ms
ms
ms
8
8
9
9
9
1
1
1
1
1
tDL
tlOV1
tlOV2
11
21
1.4
⎯
2.6
50
Load short-circuiting detection delay time tSHORT
DELAY TIME (Ta = 40 to
85 °C) *1
10
μs
−
+
⎯
⎯
⎯
⎯
⎯
1
1
1
1
1
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
tCU
69
17
9
125
31
16
2
212
53
ms
ms
ms
ms
8
8
9
9
9
tDL
tIOV1
tIOV2
27
1.1
⎯
3.4
73
Load short-circuiting detection delay time tSHORT
10
μs
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by
design, not tested in production.
12
Seiko Instruments Inc.
SII [ SEIKO INSTRUMENTS INC ]
