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S-8211CAB-M5T1G 参数 Datasheet PDF下载

S-8211CAB-M5T1G图片预览
型号: S-8211CAB-M5T1G
PDF下载: 下载PDF文件 查看货源
内容描述: 电池保护IC 1格包 [BATTERY PROTECTION IC FOR 1-CELL PACK]
分类和应用: 电池光电二极管
文件页数/大小: 41 页 / 403 K
品牌: SII [ SEIKO INSTRUMENTS INC ]
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BATTERY PROTECTION IC FOR 1-CELL PACK  
S-8211C Series  
Rev.5.0_00  
(5) S-8211CAF, S-8211CAO, S-8211CAP, S-8211CAQ, S-8211CBD, S-8211CBO  
Table 14  
Test  
Condi-  
tion  
Test  
Circuit  
Item  
Symbol  
Condition  
Min.  
Typ.  
Max. Unit  
DELAY TIME (Ta = 25 °C)  
Overcharge detection delay time  
Overdischarge detection delay time  
Discharge overcurrent detection delay time  
Load short-circuiting detection delay time  
Charge overcurrent detection delay time  
tCU  
tDL  
tDIOV  
tSHORT  
tCIOV  
0.96  
30  
7.2  
240  
7.2  
1.2  
38  
9
300  
9
1.4  
46  
11  
360  
11  
s
ms  
ms  
µs  
ms  
9
9
10  
10  
10  
5
5
5
5
5
DELAY TIME (Ta =  
40 to  
+
85 °C) *1  
tCU  
tDL  
tDIOV  
tSHORT  
tCIOV  
0.7  
20  
5
150  
5
1.2  
38  
9
300  
9
2.0  
65  
15  
540  
15  
s
ms  
ms  
9
9
10  
10  
10  
5
5
5
5
5
Overcharge detection delay time  
Overdischarge detection delay time  
Discharge overcurrent detection delay time  
Load short-circuiting detection delay time  
Charge overcurrent detection delay time  
µ
s
ms  
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed  
by design, not tested in production.  
(6) S-8211CAW  
Table 15  
Test  
Test  
Item  
Symbol  
Condition  
Min.  
Typ.  
Max. Unit Condi-  
tion  
Circuit  
DELAY TIME (Ta = 25 °C)  
Overcharge detection delay time  
Overdischarge detection delay time  
Discharge overcurrent detection delay time  
Load short-circuiting detection delay time  
Charge overcurrent detection delay time  
tCU  
tDL  
tDIOV  
tSHORT  
tCIOV  
0.96  
120  
3.6  
240  
7.2  
1.2  
150  
4.5  
300  
9
1.4  
180  
5.4  
360  
11  
s
ms  
ms  
µs  
ms  
9
9
10  
10  
10  
5
5
5
5
5
DELAY TIME (Ta =  
40 to  
+
85 °C) *1  
tCU  
tDL  
tDIOV  
tSHORT  
tCIOV  
0.7  
83  
2.5  
150  
5
1.2  
150  
4.5  
300  
9
2.0  
255  
7.7  
540  
15  
s
ms  
ms  
9
9
10  
10  
10  
5
5
5
5
5
Overcharge detection delay time  
Overdischarge detection delay time  
Discharge overcurrent detection delay time  
Load short-circuiting detection delay time  
Charge overcurrent detection delay time  
µ
s
ms  
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed  
by design, not tested in production.  
Seiko Instruments Inc.  
13  
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