BATTERY PROTECTION IC FOR 1-CELL PACK
S-8211C Series
Rev.5.0_00
(3) S-8211CAD
Table 12
Test
Test
Item
Symbol
Condition
Min.
Typ.
Max. Unit Condi-
Circuit
tion
DELAY TIME (Ta = 25 °C)
tCU
−
−
−
−
−
115
30
14.5
240
7.2
143
38
172
46
ms
ms
ms
9
5
5
5
5
5
Overcharge detection delay time
tDL
9
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
tDIOV
tSHORT
tCIOV
18
22
10
10
10
300
9
360
11
µ
s
ms
DELAY TIME (Ta =
−
40 to
+
85 °C) *1
tCU
tDL
tDIOV
tSHORT
tCIOV
−
−
−
−
−
82
20
10
150
5
143
38
18
300
9
240
65
30
540
15
ms
ms
ms
9
9
10
10
10
5
5
5
5
5
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
µ
ms
s
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed
by design, not tested in production.
(4) S-8211CAE, S-8211CAT, S-8211CAX, S-8211CBR
Table 13
Test
Test
Item
Symbol
Condition
Min.
Typ.
Max. Unit Condi-
tion
Circuit
DELAY TIME (Ta = 25 °C)
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
tCU
tDL
tDIOV
tSHORT
tCIOV
−
−
−
−
−
0.96
120
14.5
240
7.2
1.2
150
18
300
9
1.4
180
22
360
11
s
ms
ms
µs
ms
9
9
10
10
10
5
5
5
5
5
DELAY TIME (Ta =
−
40 to
+
85 °C) *1
tCU
tDL
tDIOV
tSHORT
tCIOV
−
−
−
−
−
0.7
83
10
150
5
1.2
150
18
300
9
2.0
255
30
540
15
s
ms
ms
9
9
10
10
10
5
5
5
5
5
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
µ
s
ms
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed
by design, not tested in production.
12
Seiko Instruments Inc.