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K9K1208D0C 参数 Datasheet PDF下载

K9K1208D0C图片预览
型号: K9K1208D0C
PDF下载: 下载PDF文件 查看货源
内容描述: 64M ×8位, 32M x 16位NAND闪存 [64M x 8 Bit , 32M x 16 Bit NAND Flash Memory]
分类和应用: 闪存
文件页数/大小: 39 页 / 955 K
品牌: SAMSUNG [ SAMSUNG ]
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K9K1208Q0C  
K9K1208D0C  
K9K1208U0C  
K9K1216Q0C  
K9K1216D0C  
K9K1216U0C  
FLASH MEMORY  
NAND Flash Technical Notes (Continued)  
Error in write or read operation  
Within its life time, the additional invalid blocks may develop with NAND Flash memory. Refer to the qualification report for the actual  
data.The following possible failure modes should be considered to implement a highly reliable system. In the case of status read fail-  
ure after erase or program, block replacement should be done. Because program status fail during a page program does not affect  
the data of the other pages in the same block, block replacement can be executed with a page-sized buffer by finding an erased  
empty block and reprogramming the current target data and copying the rest of the replaced block. In case of Read, ECC must be  
employed. To improve the efficiency of memory space, it is recommended that the read or verification failure due to single bit error be  
reclaimed by ECC without any block replacement. The said additional block failure rate does not include those reclaimed blocks.  
Failure Mode  
Erase Failure  
Detection and Countermeasure sequence  
Status Read after Erase --> Block Replacement  
Status Read after Program --> Block Replacement  
Verify ECC -> ECC Correction  
Write  
Read  
Program Failure  
Single Bit Failure  
: Error Correcting Code --> Hamming Code etc.  
Example) 1bit correction & 2bit detection  
ECC  
Program Flow Chart  
Start  
Write 80h  
Write Address  
Write Data  
Write 10h  
Read Status Register  
No  
I/O 6 = 1 ?  
or R/B = 1 ?  
Yes  
*
No  
Program Error  
I/O 0 = 0 ?  
Yes  
Program Completed  
: If program operation results in an error, map out  
the block including the page in error and copy the  
target data to another block.  
*
15  
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