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K4S561632E-UC60 参数 Datasheet PDF下载

K4S561632E-UC60图片预览
型号: K4S561632E-UC60
PDF下载: 下载PDF文件 查看货源
内容描述: 256Mb的电子芯片SDRAM规格54 TSOP- II与无铅(符合RoHS标准) [256Mb E-die SDRAM Specification 54 TSOP-II with Pb-Free (RoHS compliant)]
分类和应用: 电子动态存储器
文件页数/大小: 14 页 / 200 K
品牌: SAMSUNG [ SAMSUNG ]
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CMOS SDRAM  
SDRAM 256Mb E-die (x4, x8, x16)  
PIN CONFIGURATION (Top view)  
x8  
x4  
x4  
x8  
x16  
x16  
VDD  
VDD  
VDD  
1
2
3
4
5
6
7
8
9
10  
VSS  
VSS  
VSS  
54  
53  
52  
51  
50  
49  
48  
47  
46  
45  
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
28  
DQ0  
VDDQ  
DQ1  
DQ2  
VSSQ  
DQ3  
DQ4  
VDDQ  
DQ5  
DQ6  
VSSQ  
DQ7  
VDD  
LDQM  
WE  
CAS  
RAS  
CS  
BA0  
BA1  
DQ0  
VDDQ  
N.C  
DQ1  
VSSQ  
N.C  
DQ2  
VDDQ  
N.C  
DQ3  
VSSQ  
N.C  
VDD  
N.C  
WE  
CAS  
RAS  
CS  
BA0  
BA1  
N.C  
VDDQ  
N.C  
DQ0  
VSSQ  
N.C  
N.C  
VDDQ  
N.C  
N.C  
VSSQ  
N.C  
DQ3  
VDDQ  
N.C  
N.C  
VSSQ  
N.C  
DQ2  
VDDQ  
N.C  
DQ7  
VSSQ  
N.C  
DQ6  
VDDQ  
N.C  
DQ5  
VSSQ  
N.C  
DQ4  
VDDQ  
N.C  
DQ15  
VSSQ  
DQ14  
DQ13  
VDDQ  
DQ12  
DQ11  
VSSQ  
DQ10  
DQ9  
DQ1 11  
VSSQ  
N.C  
VDD  
N.C  
WE 16  
CAS 17  
RAS 18  
CS 19  
12  
13  
14  
15  
VDDQ  
DQ8  
VSS  
VSS  
VSS  
N.C/RFU N.C/RFU N.C/RFU  
DQM  
CLK  
CKE  
A12  
A11  
A9  
A8  
A7  
A6  
A5  
DQM  
CLK  
CKE  
A12  
A11  
A9  
A8  
A7  
A6  
A5  
UDQM  
CLK  
CKE  
A12  
A11  
A9  
A8  
A7  
A6  
A5  
BA0 20  
BA1 21  
A10/AP A10/AP A10/AP 22  
A0  
A1  
A2  
A3  
VDD  
A0  
A1  
A2  
A3  
VDD  
A0 23  
A1 24  
A2 25  
A3 26  
54Pin TSOP  
(400mil x 875mil)  
(0.8 mm Pin pitch)  
A4  
VSS  
A4  
VSS  
A4  
VSS  
VDD  
27  
PIN FUNCTION DESCRIPTION  
Pin  
Name  
System clock  
Input Function  
Active on the positive going edge to sample all inputs.  
CLK  
CS  
Disables or enables device operation by masking or enabling all inputs except  
CLK, CKE and DQM  
Chip select  
Masks system clock to freeze operation from the next clock cycle.  
CKE should be enabled at least one cycle prior to new command.  
Disable input buffers for power down in standby.  
CKE  
Clock enable  
Row/column addresses are multiplexed on the same pins.  
Row address : RA0 ~ RA12,  
A0 ~ A12  
Address  
Column address : (x4 : CA0 ~ CA9,CA11), (x8 : CA0 ~ CA9), (x16 : CA0 ~ CA8)  
Selects bank to be activated during row address latch time.  
Selects bank for read/write during column address latch time.  
BA0 ~ BA1  
RAS  
Bank select address  
Row address strobe  
Column address strobe  
Write enable  
Latches row addresses on the positive going edge of the CLK with RAS low.  
Enables row access & precharge.  
Latches column addresses on the positive going edge of the CLK with CAS low.  
Enables column access.  
CAS  
Enables write operation and row precharge.  
Latches data in starting from CAS, WE active.  
WE  
Makes data output Hi-Z, tSHZ after the clock and masks the output.  
Blocks data input when DQM active.  
DQM  
Data input/output mask  
Data inputs/outputs are multiplexed on the same pins.  
(x4 : DQ0 ~ 3), (x8 : DQ0 ~ 7), (x16 : DQ0 ~ 15)  
DQ0 ~ N  
Data input/output  
VDD/VSS  
VDDQ/VSSQ  
Power supply/ground  
Data output power/ground  
Power and ground for the input buffers and the core logic.  
Isolated power supply and ground for the output buffers to provide improved noise  
immunity.  
No connection  
/reserved for future use  
N.C/RFU  
This pin is recommended to be left No Connection on the device.  
Rev. 1.3 August 2004