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JANTXV2N2919L 参数 Datasheet PDF下载

JANTXV2N2919L图片预览
型号: JANTXV2N2919L
PDF下载: 下载PDF文件 查看货源
内容描述: [Small Signal Bipolar Transistor, 0.03A I(C), 60V V(BR)CEO, 2-Element, NPN, Silicon, SIMILAR TO TO-78, 6 PIN]
分类和应用: 晶体管
文件页数/大小: 20 页 / 231 K
品牌: RAYTHEON [ RAYTHEON COMPANY ]
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MIL-PRF-19500/355M
1.4 Primary electrical characteristics of each individual section. Unless otherwise specified, T
C
=+25°C.
h
FE1
V
CE
= 5 V dc
I
C
= 10
µA
dc
2N2919 2N2919L
2N2920 2N2920L
2N2919U
2N2920U
Min
Max
60
240
175
600
|h
fe
|
V
CE
= 5 V dc
I
C
= 0.5 mA dc
f = 20 MHz
3.0
20
V
CE(SAT)
I
C
= 1 mA dc
I
B
= 100
µA
dc
V dc
0.3
1.5 Primary electrical matching characteristics of each individual section. Unless otherwise specified, T
C
=+25°C.
h
FE
2
1
h
FE
2
2
V
CE
= 5 V dc
I
C
= 100
µA
dc
(1)
|V
BE1
- V
BE2
|
1
|∆(V
BE1
- V
BE2
)
∆TA
|
1
|∆(V
BE1
- V
BE2
)
∆TA
|
2
V
CE
= 5 V dc
I
C
= 10
µA
dc
V
CE
= 5 V dc
I
C
= 100
µA
dc
T
A
= +25°C and -55°C
mV dc
V
CE
= 5 V dc
I
C
= 100
µA
dc
T
A
= +125°C and +25°C
mV dc
1.0
mV dc
Min
0.9
5
0.8
Max
1.0
(1) The larger number will be placed in the denominator.
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This
section does not include documents cited in other sections of this specification or recommended for additional
information or as examples. While every effort has been made to ensure the completeness of this list, document
users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this
specification, whether or not they are listed.
2.2 Government documents.
2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a
part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are
those cited in the solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-19500
-
Semiconductor Devices, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-750
-
Test Methods for Semiconductor Devices.
(Copies of these documents are available online at
or
or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D,
Philadelphia, PA 19111-5094.)
2.3 Order of precedence. In the event of a conflict between the text of this document and the references cited
herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws
and regulations unless a specific exemption has been obtained.
2