May 2008
rev 0.5
ASM3P622S00B/E
Spread Spectrum Control and Input-Output Skew Table
Device
Input Frequency
SS %
Deviation
Input-Output Skew (±TSKEW)
0
1
±0.25 %
±0.50 %
0.0625
0.125
ASM3P622S00B/E
12MHz
Note: TSKEW is measured in units of the Clock Period
Absolute Maximum Ratings
Symbol
Parameter
Rating
Unit
VDD
Supply Voltage to Ground Potential
-0.5 to +4.6
V
VIN
TSTG
Ts
DC Input Voltage (CLKIN)
Storage temperature
-0.5 to +7
-65 to +125
°C
°C
°C
KV
Max. Soldering Temperature (10 sec)
Junction Temperature
260
150
2
TJ
TDV
Static Discharge Voltage (As per JEDEC STD22- A114-B)
Note: These are stress ratings only and are not implied for functional use. Exposure to absolute maximum ratings for prolonged periods of time may affect
device reliability.
Operating Conditions
Parameter
Description
Min
3.0
Max
3.6
+85
30
Unit
V
VDD
TA
Supply Voltage
Operating Temperature (Ambient Temperature)
Load Capacitance
-40
°C
CL
pF
pF
CIN
Input Capacitance
7
Electrical Characteristics
Parameter
Description
Test Conditions
Min
Typ
Max
Unit
V
VIL
VIH
IIL
Input LOW Voltage5
Input HIGH Voltage5
Input LOW Current
Input HIGH Current
Output LOW Voltage6
Output HIGH Voltage6
Supply Current
0.8
2.0
V
VIN = 0V
50
100
0.4
µA
µA
V
IIH
VIN = VDD
VOL
VOH
IDD
Zo
IOL = 8mA
IOH = -8mA
2.4
V
Unloaded outputs
18
mA
Ω
Output Impedance
23
Note: 5. CLKIN input has a threshold voltage of VDD/2
6. Parameter is guaranteed by design and characterization. Not 100% tested in production
Low Frequency Timing-Safe™ Peak EMI Reduction IC
5 of 15
Notice: The information in this document is subject to change without notice.
PULSECORE [ PulseCore Semiconductor ]
