欢迎访问ic37.com |
会员登录 免费注册
发布采购

PM7351-BGI 参数 Datasheet PDF下载

PM7351-BGI图片预览
型号: PM7351-BGI
PDF下载: 下载PDF文件 查看货源
内容描述: [Support Circuit, 1-Func, CMOS, PBGA304, 31 X 31 MM, 1.51 MM HEIGHT, 1.27 MM PITCH, SBGA-304]
分类和应用: ATM异步传输模式电信电信集成电路
文件页数/大小: 174 页 / 1840 K
品牌: PMC [ PMC-SIERRA, INC ]
 浏览型号PM7351-BGI的Datasheet PDF文件第123页浏览型号PM7351-BGI的Datasheet PDF文件第124页浏览型号PM7351-BGI的Datasheet PDF文件第125页浏览型号PM7351-BGI的Datasheet PDF文件第126页浏览型号PM7351-BGI的Datasheet PDF文件第128页浏览型号PM7351-BGI的Datasheet PDF文件第129页浏览型号PM7351-BGI的Datasheet PDF文件第130页浏览型号PM7351-BGI的Datasheet PDF文件第131页  
RELEASED  
PM7351 S/UNI-VORTEX  
DATA SHEET  
PMC-1980582  
ISSUE 5  
OCTAL SERIAL LINK MULTIPLEXER  
11  
TEST FEATURES DESCRIPTION  
Simultaneously asserting (low) the CSB, RDB and WRB inputs causes all digital  
output pins and the data bus to be held in a high-impedance state. This test  
feature may be used for board testing.  
Test mode registers are used to apply test vectors during production testing of  
the S/UNI-VORTEX. Test mode registers (as opposed to normal mode registers)  
are selected when TRS (A[9]) is high.  
The S/UNI-VORTEX supports a standard IEEE 1149.1 five-signal JTAG  
boundary scan test port for use in board testing. All digital device inputs may be  
read and all digital device outputs may be forced via the JTAG test port, except  
the TXDn+/- and RXDn+/- signals.  
A limited RAM built-in-self-test (BIST) is available.  
Notes on Test Mode Register Bits:  
1. Writing values into unused register bits has no effect. However, to ensure  
software compatibility with future, feature-enhanced versions of the product,  
unused register bits must be written with logic zero. Reading back unused bits  
can produce either a logic one or a logic zero; hence, unused register bits should  
be masked off by software when read.  
2. Writable test mode register bits are not initialized upon reset unless otherwise  
noted.  
PROPRIETARY AND CONFIDENTIAL TO PMC-SIERRA, INC., AND FOR ITS CUSTOMERS’ INTERNAL USE  
117  
 复制成功!