欢迎访问ic37.com |
会员登录 免费注册
发布采购

SAA7114H 参数 Datasheet PDF下载

SAA7114H图片预览
型号: SAA7114H
PDF下载: 下载PDF文件 查看货源
内容描述: PAL / NTSC / SECAM视频解码器具有自适应PAL / NTSC梳状滤波器, VBI数据限幅器和高性能的定标器 [PAL/NTSC/SECAM video decoder with adaptive PAL/NTSC combfilter, VBI-data slicer and high performance scaler]
分类和应用: 解码器转换器色度信号转换器消费电路商用集成电路
文件页数/大小: 140 页 / 549 K
品牌: NXP [ NXP ]
 浏览型号SAA7114H的Datasheet PDF文件第5页浏览型号SAA7114H的Datasheet PDF文件第6页浏览型号SAA7114H的Datasheet PDF文件第7页浏览型号SAA7114H的Datasheet PDF文件第8页浏览型号SAA7114H的Datasheet PDF文件第10页浏览型号SAA7114H的Datasheet PDF文件第11页浏览型号SAA7114H的Datasheet PDF文件第12页浏览型号SAA7114H的Datasheet PDF文件第13页  
Philips Semiconductors  
Preliminary specification  
PAL/NTSC/SECAM video decoder with adaptive PAL/NTSC  
comb filter, VBI-data slicer and high performance scaler  
SAA7114H  
SYMBOL  
TEST4  
PIN  
TYPE  
DESCRIPTION  
78  
79  
80  
O
I
do not connect; reserved for future extensions and for testing: scan output  
do not connect; reserved for future extensions and for testing: scan input  
TEST5  
XTRI  
I
X-port output control signal, affects all X-port pins (XPD7 to XPD0, XRH, XRV,  
XDQ and XCLK), enable and active polarity is under software control (bits XPE  
in subaddress 83H)  
XPD7  
81  
82  
83  
I/O  
I/O  
P
expansion port data  
XPD6  
expansion port data  
VDDD(ICO5)  
internal digital core supply voltage 5 (+3.3 V)  
expansion port data  
XPD5 to XPD2 84 to 87  
I/O  
P
VSSD(ICO3)  
XPD1  
XPD0  
XRV  
88  
89  
90  
91  
92  
93  
94  
95  
96  
97  
internal digital core supply ground 3  
expansion port data  
I/O  
I/O  
I/O  
I/O  
P
expansion port data  
vertical reference I/O expansion port  
horizontal reference I/O expansion port  
internal digital core supply voltage 6 (+3.3 V)  
clock I/O expansion port  
XRH  
VDDD(ICO6)  
XCLK  
XDQ  
I/O  
I/O  
O
data qualifier I/O expansion port  
task flag or ready signal from scaler, controlled by XRQT  
XRDY  
TRST  
I
test reset input (active LOW), for boundary scan test (with internal pull-up);  
notes 5 and 6  
TCK  
98  
99  
I
I
test clock for boundary scan test; note 1  
TMS  
test mode select input for boundary scan test or scan test; note 1  
external digital pad supply ground 4  
VSSD(EP4)  
100  
P
Notes  
1. In accordance with the “IEEE1149.1” standard the pads TDI, TMS, TCK and TRST are input pads with an internal  
pull-up transistor and TDO is a 3-state output pad.  
2. Pin strapping is done by connecting the pin to supply via a 3.3 kresistor. During the power-up reset sequence the  
corresponding pins are switched to input mode to read the strapping level. For the default setting no strapping  
resistor is necessary (internal pull-down).  
3. Pin RTCO: operates as I2C-bus slave address pin; RTCO = 0 slave address 42H/43H (default); RTCO = 1 slave  
address 40H/41H.  
4. Pin ALRCLK: 0 = 24.576 MHz crystal (default); 1 = 32.110 MHz crystal.  
5. For board design without boundary scan implementation connect the TRST pin to ground.  
6. This pin provides easy initialization of the Boundary Scan Test (BST) circuit. TRST can be used to force the Test  
Access Port (TAP) controller to the TEST_LOGIC_RESET state (normal operation) at once.  
2000 Mar 15  
9
 复制成功!