NXP Semiconductors
HEF4094B
8-stage shift-and-store register
V
I
OE input
GND
t
PLZ
V
DD
output
LOW-to-OFF
OFF-to-LOW
V
OL
t
PHZ
V
OH
output
HIGH-to-OFF
OFF-to-HIGH
GND
outputs
enabled
V
Y
V
M
V
M
t
PZL
V
M
V
X
t
PZH
outputs
disabled
outputs
enabled
001aai545
Measurement points are given in
Logic levels: V
OL
and V
OH
are typical output voltage levels that occur with the output load.
Fig 9.
3-state output enable and disable times for OE input
V
I
CP input
GND
t
su
t
h
V
I
D input
GND
V
M
t
su
t
h
V
M
V
OH
QPn, QS1, QS2 output
V
OL
001aaf115
V
M
Measurement points are given in
Logic levels: V
OL
and V
OH
are typical output voltage levels that occur with the output load.
Fig 10. Data input data set up and hold times
HEF4094B
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Product data sheet
Rev. 11 — 29 August 2013
10 of 20