Philips Semiconductors
Product specification
Dual D-type flip-flop with set and reset;
positive-edge trigger
Family 74HCT
At recommended operating conditions; voltages are referenced to GND (ground = 0 V).
TEST CONDITIONS
SYMBOL
PARAMETER
WAVEFORMS
T
amb
=
−40
to +85
°C;
note 1
V
IH
V
IL
V
OH
V
OL
I
LI
I
CC
∆I
CC
HIGH-level input
voltage
LOW-level input voltage
HIGH-level output
voltage
LOW-level output
voltage
input leakage current
quiescent supply
current
additional quiescent
supply current per input
74HC74; 74HCT74
MIN.
V
CC
(V)
TYP.
MAX.
UNIT
4.5 to 5.5
2.0
1.6
1.2
4.32
0.15
−
−
100
−
0.8
−
−
±1.0
40
450
V
V
V
V
µA
µA
µA
4.5 to 5.5
−
V
I
= V
IH
or V
IL
;
I
O
=
−4.0
mA
V
I
= V
IH
or V
IL
;
I
O
= 4.0 mA
V
I
= V
CC
or GND
V
I
= V
CC
or GND;
I
O
= 0
V
I
= V
CC
−2.1
V other
inputs at V
CC
or GND;
I
O
= 0
4.5
4.5
5.5
5.5
3.84
0.33
−
−
4.5 to 5.5
−
T
amb
=
−40
to +125
°C
V
IH
V
IL
V
OH
V
OL
I
LI
I
CC
∆I
CC
HIGH-level input
voltage
LOW-level input voltage
HIGH-level output
voltage
LOW-level output
voltage
input leakage current
quiescent supply
current
additional quiescent
supply current per input
4.5 to 5.5
2.0
−
−
−
−
−
−
−
−
0.8
−
0.4
±1.0
80
490
V
V
V
V
µA
µA
µA
4.5 to 5.5
−
V
I
= V
IH
or V
IL
;
I
O
=
−4.0
mA
V
I
= V
IH
or V
IL
;
I
O
= 4.0 mA
V
I
= V
CC
or GND
V
I
= V
CC
or GND;
I
O
= 0
V
I
= V
CC
−2.1
V other
inputs at V
CC
or GND;
I
O
= 0
4.5
4.5
5.5
5.5
3.7
−
−
−
4.5 to 5.5
−
Note
1. All typical values are measured at T
amb
= 25
°C.
Remark to HCT types
The value of additional quiescent supply current (∆I
CC
) for a unit load of 1 is given here. To determine
∆I
CC
per input,
multiply this value by the unit load coefficient shown in the table.
INPUT
nD
nRD
nSD
nCP
UNIT LOAD COEFFICIENT
0.70
0.70
0.80
0.80
2003 Jul 10
9
PHILIPS [ NXP SEMICONDUCTORS ]
