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NCS37020DTBR2G 参数 Datasheet PDF下载

NCS37020DTBR2G图片预览
型号: NCS37020DTBR2G
PDF下载: 下载PDF文件 查看货源
内容描述: [Self-Test Appliance Leakage Circuit Interrupter (ALCI)]
分类和应用: 外围集成电路
文件页数/大小: 13 页 / 361 K
品牌: ONSEMI [ ONSEMI ]
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NCS37020  
Functional Description (refer to application circuit, Figure 2)  
The NCS37020 provides for a single IC controller  
solution for ground fault protection and selftest auto  
monitoring per UL standard UL943B.  
The key internal blocks include: 12 V shunt regulator,  
precision bandgap reference, two 3.3 V linear regulators  
(one for the digital and one for the analog circuit), CT sense  
The first selftest (ST) cycle will occur at one second and  
thereafter every 12 minutes. During the ST cycle, the Fault  
Test pin will be enabled during the positive half cycle and the  
CT current (set at 12 mA, R8) will be verified. During the  
next negative half cycle, the SCR’s anode voltage will be  
prebiased by the SCR Test pin to 3.3 volts. The SCR will  
then be enabled and the SCR’s anode voltage will be  
monitored by the SCR Test pin. If the anode voltage goes  
below 2.1 volts, the SCR will be disabled after a 400 ms  
verification check and the ST logic will register a passing ST  
cycle. Figure 2 shows two SCRs in series. A redundant SCR  
is required during the SCR anode to cathode short test to  
prevent the solenoid from burn out damage. The SCR  
self–test cycle will fail if either SCR Q1A or Q1B are open.  
If either Q1A or Q1B are shorted (anode to cathode) the ST  
cycle will pass, however, the GF function will also function  
correctly. The next ST cycle will occur in 12 minutes. Note  
that when the SCR is enabled, the blocking diode D5 will  
prevent the solenoid from being energized and opening the  
load contacts. If either the GF (ground fault) or SCR  
selftest cycles fail, these selftest cycles will be repeated  
for up to three more consecutive cycles. If any consecutive  
GF and SCR tests pass, the ST logic will register a passing  
selftest cycle. If all four ST consecutive cycles fail, a ST  
cycle will be repeated at 2, 3 and 4 seconds for a total of 16  
selftest cycles. If all 16 ST cycles fail, a ST EOL fault will  
occur. The SCR will be enabled for four consecutive positive  
half cycles, then the LED will blink at 4 Hz. The LED will  
only be biased during the positive AC half wave cycle. The  
SCR will be enabled for one positive half cycle every 4.5  
seconds. A selftest cycle will occur every second. If a  
selftest cycle passes, the ST EOL logic will be reset (power  
on reset state). If a ground fault is detected during a ST EOL  
state, the EOL logic will be reset. This allows for resetting  
the ST EOL state by pressing the manual test button when  
the load contacts are closed.  
amplifier with V dynamic cancellation, 1.65 V reference  
OS  
for the CT, 2 MHz oscillator dynamically trimmed to the AC  
line frequency, 8 bit SAR ADC, comparators, digital filters  
and digital control logic.  
The internal shunt regulator clamps the SUP pin voltage  
at 12 volts. This provides the bias voltage for the analog and  
digital internal circuitry via two 3.3 V linear regulators. The  
NCS37020 controller can be biased full wave or half wave.  
Figure 2 shows a half wave bias application. Half wave bias  
allows for lower wattage bias resistors (R1A and R1B) and  
less redundant bias diodes. The D14 diodes are biased so  
that only during the positive half cycle the capacitor C1 will  
be charged to 12 volts. During the negative half cycle, C1  
will supply the bias current for the NCS37020. To minimize  
the NCS37020 bias current during the negative half cycle,  
the SCR and LED outputs will only be enabled during the  
positive half cycle. The D14 diodes and R1AR1B  
resistors include redundant components to pass the UL943B  
standard.  
At POR (power on reset) detection (SUP>4 V) the logic  
is reset and the bias circuitry is enabled. The Phase pin  
continually checks for an input signal. There is a 1 mA pull  
down internal current source connected to this pin so a  
floating or open pin will be biased low. If there is no  
50/60 Hz signal detected on this pin for greater than 32 ms  
due to an open solenoid or open R2 resistor, a “no clock” End  
of Life (EOL) fault will occur. After ~150 ms, the LED  
indicator logic will be enabled and blink at 4 Hz. The SCR  
will be enabled for one positive half cycle every 4 seconds.  
The “no clock” EOL logic state will continue until a POR  
occurs or a 50/60 Hz signal is detected on the Phase pin.  
When a 50/60 Hz signal is detected, the no clock EOL state  
will be reset and a ST (selftest) cycle will occur after 75 ms.  
If this ST cycle passes, the next ST cycle will occur in 12  
minutes. If four consecutive no clock ST cycles fail, a ST  
EOL fault will occur. During a no clock EOL state, the phase  
information will be detected by the shunt regulator’s bias  
circuitry. The shunt regulator will detect an AC zero cross by  
monitoring the Shunt regulator’s clamp current. When the  
VAC voltage crosses ~80 volts, a zero cross is registered by  
the shunt regulator’s circuitry.  
The above no clock and GF/SCR selftest functions  
rd  
provide for full UL943B (3 Edition) compliance for the  
auto monitoring requirement. The NCS37020 IC controller  
tests for the CT, solenoid, clock input, SCR and bias  
circuitry.  
The CT is biased at 1.65 volts. The CT sense amplifier  
monitors the ground fault current. This current is converted  
to a voltage level at the CTO pin which is the input to the  
ADC (IDF pin). The resistor R5 sets the GF threshold per the  
following equation:  
ǒ
Ǔ
0.203   CT1   RCT1 ) R7 ) 2pfACLCT1  
Note, the “no clock” EOL logic can be used in production  
testing for generation of an EOL state and enabling the LED  
indicator. If a DC voltage greater than ~75 volts is applied  
to the Line Hot input, the NCS37020 will be biased correctly  
but will not see a zero cross signal and a “no clock” ST EOL  
failure will occur. The LED will be enabled within 150 ms.  
Idiff  
+
(eq. 1)  
ǒ
Ǔ
R5   RCT1 ) 2pfACLCT1  
CT = Turns ratio of differential CT  
1
R
CT1  
= DC winding resistance of differential CT  
f
= AC mains frequency  
AC  
L
= Inductance of differential CT  
CT1  
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