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MC33153P 参数 Datasheet PDF下载

MC33153P图片预览
型号: MC33153P
PDF下载: 下载PDF文件 查看货源
内容描述: 单IGBT栅极驱动器 [Single IGBT Gate Driver]
分类和应用: 驱动器MOSFET驱动器栅极驱动程序和接口接口集成电路光电二极管双极性晶体管栅极驱动
文件页数/大小: 13 页 / 131 K
品牌: ONSEMI [ ONSEMI ]
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MC33153  
saturation. When the collector current rises above the knee,  
the device pulls out of saturation. The maximum current the  
device will conduct in the linear region is a function of the  
been cleared, the voltage will come down quickly to the  
V of the device. Following turn−on, there is normally  
CE(sat)  
considerable ringing on the collector due to the C  
OSS  
base current and the dc current gain (h ) of the transistor.  
capacitance of the IGBTs and the parasitic wiring  
inductance. The fault signal from the Desaturation  
Comparator must be blanked sufficiently to allow the diode  
to be cleared and the ringing to settle out.  
FE  
The output characteristics of an IGBT are similar to a  
Bipolar device. However, the output current is a function of  
gate voltage instead of current. The maximum current  
depends on the gate voltage and the device type. IGBTs tend  
to have a very high transconductance and a much higher  
current density under a short circuit than a bipolar device.  
Motor control IGBTs are designed for a lower current  
density under shorted conditions and a longer short circuit  
survival time.  
The best method for detecting desaturation is the use of a  
high voltage clamp diode and a comparator. The MC33153  
has a Fault Blanking/Desaturation Comparator which  
senses the collector voltage and provides an output  
indicating when the device is not fully saturated. Diode D1  
is an external high voltage diode with a rated voltage  
comparable to the power device. When the IGBT is “on” and  
saturated, D1 will pull down the voltage on the Fault  
Blanking/Desaturation Input. When the IGBT pulls out of  
saturation or is “off”, the current source will pull up the input  
and trip the comparator. The comparator threshold is 6.5 V,  
allowing a maximum on−voltage of about 5.8 V.  
The blanking function uses an NPN transistor to clamp the  
comparator input when the gate input is low. When the input  
is switched high, the clamp transistor will turn “off”,  
allowing the internal current source to charge the blanking  
capacitor. The time required for the blanking capacitor to  
charge up from the on−voltage of the internal NPN transistor  
to the trip voltage of the comparator is the blanking time.  
If a short circuit occurs after the IGBT is turned on and  
saturated, the delay time will be the time required for the  
current source to charge up the blanking capacitor from the  
V
CE(sat)  
level of the IGBT to the trip voltage of the  
comparator. Fault blanking can be disabled by leaving Pin 8  
unconnected.  
Sense IGBT Protection  
Another approach to protecting the IGBTs is to sense the  
emitter current using a current shunt or Sense IGBTs. This  
method has the advantage of being able to use high gain  
IGBTs which do not have any inherent short circuit  
capability. Current sense IGBTs work as well as current  
sense MOSFETs in most circumstances. However, the basic  
problem of working with very low sense voltages still exists.  
Sense IGBTs sense current through the channel and are  
therefore linear with respect to the collector current.  
Because IGBTs have a very low incremental on−resistance,  
sense IGBTs behave much like low−on resistance current  
sense MOSFETs. The output voltage of a properly  
terminated sense IGBT is very low, normally less than  
100 mV.  
A fault exists when the gate input is high and V is  
CE  
greater than the maximum allowable V . The output of  
CE(sat)  
the Desaturation Comparator is ANDed with the gate input  
signal and fed into the Short Circuit and Overcurrent  
Latches. The Overcurrent Latch will turn−off the IGBT for  
the remainder of the cycle when a fault is detected. When  
input goes high, both latches are reset. The reference voltage  
is tied to the Kelvin Ground instead of the V to make the  
EE  
threshold independent of negative gate bias. Note that for  
proper operation of the Desaturation Comparator and the  
Fault Output, the Current Sense Input must be biased above  
the Overcurrent and Short Circuit Comparator thresholds.  
The sense IGBT approach requires fault blanking to  
prevent false tripping during turn−on. The sense IGBT also  
requires that the sense signal is ignored while the gate is low.  
This is because the mirror output normally produces large  
transient voltages during both turn−on and turn−off due to  
the collector to mirror capacitance. With non−sensing types  
of IGBTs, a low resistance current shunt (5.0 to 50 mW) can  
be used to sense the emitter current. When the output is an  
actual short circuit, the inductance will be very low. Since  
the blanking circuit provides a fixed minimum on−time, the  
peak current under a short circuit can be very high. A short  
circuit discern function is implemented by the second  
comparator which has a higher trip voltage. The short circuit  
signal is latched and appears at the Fault Output. When a  
short circuit is detected, the IGBT should be turned−off for  
several milliseconds allowing it to cool down before it is  
turned back on. The sense circuit is very similar to the  
desaturation circuit. It is possible to build a combination  
circuit that provides protection for both Short Circuit  
capable IGBTs and Sense IGBTs.  
This can be accomplished by connecting Pin 1 to V  
.
CC  
V
CC  
Desaturation  
Comparator  
V
CC  
270 mA  
D1  
8
V
ref  
6.5 V  
V
EE  
Kelvin  
GND  
Figure 34. Desaturation Detection  
The MC33153 also features a programmable fault  
blanking time. During turn−on, the IGBT must clear the  
opposing free−wheeling diode. The collector voltage will  
remain high until the diode is cleared. Once the diode has  
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