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CAT93C86VI-GT3REVC 参数 Datasheet PDF下载

CAT93C86VI-GT3REVC图片预览
型号: CAT93C86VI-GT3REVC
PDF下载: 下载PDF文件 查看货源
内容描述: [1KX16 MICROWIRE BUS SERIAL EEPROM, PDSO8, 0.150 INCH, ROHS COMPLIANT, MS-012, SOIC-8]
分类和应用: 可编程只读存储器电动程控只读存储器电可擦编程只读存储器时钟光电二极管内存集成电路
文件页数/大小: 10 页 / 148 K
品牌: ONSEMI [ ON SEMICONDUCTOR ]
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CAT93C86
Table 1. ABSOLUTE MAXIMUM RATINGS
Parameters
Temperature Under Bias
Storage Temperature
Voltage on any Pin with Respect to Ground (Note 1)
V
CC
with Respect to Ground
Package Power Dissipation Capability (T
A
= 25°C)
Lead Soldering Temperature (10 seconds)
Output Short Circuit Current (Note 2)
Ratings
−55
to +125
−65
to +150
−2.0
to +V
CC
+2.0
−2.0
to +7.0
1.0
300
100
Units
°C
°C
V
V
W
°C
mA
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. The minimum DC input voltage is
−0.5
V. During transitions, inputs may undershoot to
−2.0
V for periods of less than 20 ns. Maximum DC
voltage on output pins is V
CC
+0.5 V, which may overshoot to V
CC
+2.0 V for periods of less than 20 ns.
2. Output shorted for no more than one second. No more than one output shorted at a time.
Table 2. RELIABILITY CHARACTERISTICS
Symbol
N
END
(Note 3)
T
DR
(Note 3)
V
ZAP
(Note 3)
I
LTH
(Notes 3, 4)
Parameter
Endurance
Data Retention
ESD Susceptibility
Latch−Up
Reference Test Method
MIL−STD−883, Test Method 1033
MIL−STD−883, Test Method 1008
MIL−STD−883, Test Method 3015
JEDEC Standard 17
Min
1,000,000
100
2000
100
Units
Cycles/Byte
Years
V
mA
3. These parameters are tested initially and after a design or process change that affects the parameter.
4. Latch−up protection is provided for stresses up to 100 mA on address and data pins from
−1
V to V
CC
+1 V.
Table 3. D.C. OPERATING CHARACTERISTICS
(V
CC
= +1.8 V to +5.5 V unless otherwise specified.)
Symbol
I
CC1
I
CC2
I
SB1
I
SB2
I
LI
I
LO
V
IL1
V
IH1
V
IL2
V
IH2
V
OL1
V
OH1
V
OL2
V
OH2
Parameter
Power Supply Current (Write)
Power Supply Current (Read)
Power Supply Current
(Standby) (x8 Mode)
Power Supply Current
(Standby) (x16 Mode)
Input Leakage Current
Output Leakage Current
(Including ORG pin)
Input Low Voltage
Input High Voltage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Output Low Voltage
Output High Voltage
Test Conditions
f
SK
= 1 MHz; V
CC
= 5.0 V
f
SK
= 1 MHz; V
CC
= 5.0 V
CS = 0 V ORG = GND
CS = 0 V ORG = Float or V
CC
V
IN
= 0 V to V
CC
V
OUT
= 0 V to V
CC
, CS = 0 V
4.5 V
V
CC
< 5.5 V
4.5 V
V
CC
< 5.5 V
1.8 V
V
CC
< 4.5 V
1.8 V
V
CC
< 4.5 V
4.5 V
V
CC
< 5.5 V; I
OL
= 2.1 mA
4.5 V
V
CC
< 5.5 V; I
OH
=
−400
mA
1.8 V
V
CC
< 4.5 V; I
OL
= 1 mA
1.8 V
V
CC
< 4.5 V; I
OH
=
−100
mA
V
CC
0.2
2.4
0.2
−0.1
2
0
V
CC
x 0.7
0
Min
Typ
Max
3
500
10
10
1
1
0.8
V
CC
+ 1
V
CC
x 0.2
V
CC
+ 1
0.4
Units
mA
mA
mA
mA
mA
mA
V
V
V
V
V
V
V
V
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