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LPC54018JBD208 参数 Datasheet PDF下载

LPC54018JBD208图片预览
型号: LPC54018JBD208
PDF下载: 下载PDF文件 查看货源
内容描述: [32-bit ARM Cortex-M4 microcontroller]
分类和应用:
文件页数/大小: 168 页 / 3551 K
品牌: NXP [ NXP ]
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LPC540xx  
NXP Semiconductors  
32-bit ARM Cortex-M4 microcontroller  
12.2 12-bit ADC characteristics  
Table 52. 12-bit ADC static characteristics  
amb = 40 C to +105 C; 1.71 V VDD 3.6 V; VSSA = VREFN = GND. ADC calibrated at Tamb = 25C.  
T
Symbol  
Parameter  
Conditions  
Min  
Typ[2]  
Max  
Unit  
[3]  
[4]  
VIA  
analog input  
voltage  
0
-
-
VDDA  
V
Cia  
analog input  
capacitance  
5.0  
-
-
pF  
fclk(ADC)  
fs  
ADC clock  
frequency  
80  
5.3  
-
MHz  
sampling  
frequency  
-
-
5.0  
3.0  
Msamples/s  
LSB  
[1][5]  
[1][5]  
ED  
differential linearity 2.0 V VDDA 3.6 V  
error  
2.0 V < VREFP 3.6 V  
fclk(ADC) = 80 MHz  
1.71 V VDDA 2.0 V  
1.71 V VREFP 2.0 V  
fclk(ADC) = 80 MHz  
-
4.5  
-
LSB  
[1][5]  
[1][6]  
-
-
-
-
LSB  
LSB  
EL(adj)  
integral  
non-linearity  
2.0 V VDDA 3.6 V  
2.0 V < VREFP 3.6 V  
fclk(ADC) = 80 MHz  
4.0  
7.5  
[1][6]  
1.71 V VDDA 2.0 V  
1.71 V VREFP 2.0 V  
fclk(ADC) = 80 MHz  
-
-
LSB  
[1][6]  
[1][7]  
[1][8]  
-
-
-
-
-
-
LSB  
mV  
EO  
offset error  
calibration enabled  
2.2  
3.0  
Verr(FS)  
full-scale error  
voltage  
2.0 V VDDA 3.6 V  
2.0 V < VREFP 3.6 V  
fclk(ADC) = 80 MHz  
LSB  
1.71 V VDDA 2.0 V  
1.71 V VREFP 2.0 V  
fclk(ADC) = 80 MHz  
-
2.5  
-
-
LSB  
[9][10]  
Zi  
input impedance  
fs = 5.0 Msamples/s  
17.0  
-
k  
[1] Based on characterization; not tested in production.  
[2] Typical ratings are not guaranteed. The values listed are at room temperature (25 C), nominal supply  
voltages.  
[3] The input resistance of ADC channels 6 to 11 is higher than ADC channels 0 to 5.  
[4] Cia represents the external capacitance on the analog input channel for sampling speeds of  
5.0 Msamples/s. No parasitic capacitances included.  
[5] The differential linearity error (ED) is the difference between the actual step width and the ideal step width.  
See Figure 41.  
[6] The integral non-linearity (EL(adj)) is the peak difference between the center of the steps of the actual and  
the ideal transfer curve after appropriate adjustment of gain and offset errors. See Figure 41.  
[7] The offset error (EO) is the absolute difference between the straight line which fits the actual curve and the  
straight line which fits the ideal curve. See Figure 41.  
LPC540xx  
All information provided in this document is subject to legal disclaimers.  
© NXP Semiconductors N.V. 2018. All rights reserved.  
Product data sheet  
Rev. 1.8 — 22 June 2018  
138 of 168  
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