NXP Semiconductors
FXPS7115D4
Digital absolute pressure sensor, 40 kPa to 115 kPa
7.3.2 Self-test functions
The device includes analog and digital self-test functions to verify the functionality of the
transducer and the signal chain. The self-test functions are selected by writing to the
ST_CTRL[3:0] bits in the DSP_CFG_U1 register. The ST_CTRL bits select the desired
self-test connection.
Once the ENDINIT bit is set, the ST_CTRL bits are forced to '0000'. Future writes to the
ST_CTRL bits are disabled until a device reset.
7.3.2.1 PABS common mode verification
When the PABS common mode self-test is selected, the ST_ACTIVE bit is set, the
ST_ERROR is cleared, and the device begins an internal measurement of the common
mode signal of the P-cells and compares the result against a predetermined limit. If the
result exceeds the limit, the ST_ERROR bit is set. The PABS common mode self-test
repeats continuously every tST_INIT when the ST_CTRL bits are set to the specified value.
Once the test is disabled, the ST_ERROR bit updates with the final test result within
tST_INIT of disabling the test. The ST_ACTIVE bit remains set until the final test result is
reported. Figure 4 is an example of a user-controlled self-test procedure.
FXPS7115D4
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© NXP B.V. 2019. All rights reserved.
Product data sheet
Rev. 3 — 5 December 2019
6 / 72
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