Philips Semiconductors
Product specification
8-bit serial-in, serial or parallel-out shift
register with output latches; 3-state
TEST CONDITIONS
SYMBOL
PARAMETER
OTHER
T
amb
=
−40
to +125
°C
V
IH
V
IL
V
OH
HIGH-level input
voltage
LOW-level input
voltage
HIGH-level output
voltage
V
I
= V
IH
or V
IL
all outputs
I
O
=
−20 µA
Q7’ standard output
I
O
=
−4.0
mA
Qn bus driver outputs
I
O
=
−6.0
mA
V
OL
LOW-level output
voltage
V
I
= V
IH
or V
IL
all outputs
I
O
= 20
µA
Q7’ standard output
I
O
= 4.0 mA
Qn bus driver outputs
I
O
= 6.0 mA
I
LI
I
OZ
I
CC
∆I
CC
Notes
1. All typical values are measured at T
amb
= 25
°C.
input leakage current
3-state output
OFF-state current
quiescent supply
current
additional supply
current per input
V
I
= V
CC
or GND
V
I
= V
IH
or V
IL
;
V
O
= V
CC
or GND
V
I
= V
CC
or GND;
I
O
= 0
V
I
= V
CC
−
2.1 V;
I
O
= 0; note 2
4.5
5.5
5.5
5.5
4.5 to 5.5
−
−
−
−
−
4.5
−
4.5
−
4.5
3.7
4.5
3.7
4.5
4.4
4.5 to 5.5
4.5 to 5.5
2.0
−
V
CC
(V)
74HC595; 74HCT595
MIN.
TYP.
MAX.
UNIT
−
−
−
0.8
V
V
−
−
−
−
−
−
V
V
V
−
−
−
−
−
−
−
0.1
0.4
0.4
±1.0
±10.0
160
490
V
V
V
µA
µA
µA
µA
2. The value of additional quiescent supply current (∆I
CC
) for a unit load of 1 is given here. To determine
∆I
CC
per input,
multiply this value by the unit load coefficient per input pin:
a. pin DS: 0.25
b. pins MR, SH_CP, ST_CP and OE: 1.50.
2003 Jun 25
12
PHILIPS [ NXP SEMICONDUCTORS ]
