M25PE80
Table 23.
DC and AC parameters
(1)
AC characteristics (50 MHz operation, T9HX (0.11µm) process
)
Test conditions specified in Table 17 and Table 18
Symbol Alt.
Parameter
Min
Typ
Max
Unit
Clock frequency for the following instructions:
FAST_READ, RDLR, PW, PP, WRLR, PE, SE,
SSE, DP, RDP, WREN, WRDI, RDSR, WRSR
fC
fR
fC
D.C.
50
33
MHz
Clock frequency for read instructions
D.C.
9
MHz
ns
(2)
tCH
tCLH Clock high time
tCLL Clock low time
(2)
tCL
9
ns
Clock slew rate(2) (peak to peak)
0.1
5
V/ns
ns
tSLCH
tCHSL
tDVCH
tCHDX
tCHSH
tSHCH
tSHSL
tCSS S active setup time (relative to C)
S not active hold time (relative to C)
tDSU Data in setup time
5
ns
2
ns
tDH Data in hold time
5
ns
S active hold time (relative to C)
S not active setup time (relative to C)
tCSH S deselect time
5
ns
5
ns
100
ns
(3)
tSHQZ
tCLQV
tCLQX
tDIS Output disable time
8
8
ns
tV
tHO Output hold time
Write protect setup time
Clock low to output valid
ns
0
ns
(4)
tWHSL
50
ns
(4)
tSHWL
Write protect hold time
100
ns
(3)
tDP
tRDP
tW
S to deep power-down
3
µs
(3)
S high to standby mode
30
15
23
µs
Write status register cycle time
Page write cycle time (256 bytes)
Page program cycle time (256 bytes)
Page program cycle time (n bytes)
Page erase cycle time
3
ms
ms
(5)
tPW
11
0.8
(4)
tPP
3
ms
int(n/8) × 0.025(6)
tPE
10
1
20
5
ms
s
tSE
tSSE
tBE
Sector erase cycle time
Subsector erase cycle time
Bulk erase cycle time
50
10
150
20
ms
s
1. See: Important note on page 6.
2. tCH + tCL must be greater than or equal to 1/ fC.
3. Value guaranteed by characterization, not 100% tested in production.
4. Only applicable as a constraint for a WRSR instruction when SRWD is set to ‘1’.
5. When using PP and PW instructions to update consecutive bytes, optimized timings are obtained with one sequence
including all the bytes versus several sequences of only a few bytes (1 ≤ n ≤ 256).
6. int(A) corresponds to the upper integer part of A. For instance, int(12/8) = 2, int(32/8) = 4 int(15.3) =16.
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