M25PE80
DC and AC parameters
Table 25. Reset conditions
Test conditions specified in Table 17 and Table 18
Symbol
Alt.
Parameter
Conditions
Min Typ Max Unit
(1)
tRLRH
tRST Reset pulse width
10
µs
ns
Chip should have been
Chip Select High to
Reset High
tSHRH
deselected before reset is de- 10
asserted
1. Value guaranteed by characterization, not 100% tested in production.
(1)(2)
Table 26. Timings after a Reset Low pulse
Test conditions specified in Table 17 and Table 18
Symb
ol
Conditions:
Reset pulse occurred
Alt. Parameter
Max
Unit
While decoding an instruction(3): WREN, WRDI,
RDID, RDSR, READ, RDLR, Fast_Read, WRLR,
PW, PP, PE, SE, BE, SSE, DP, RDP
30
µs
Under completion of an erase or program cycle of
a PW, PP, PE, SE, BE operation
300
3
µs
Reset
tRHSL tREC recovery
time
Under completion of an erase cycle of an SSE
operation
ms
tW (see
Table 23
and
Under completion of a WRSR operation
ms
µs
Table 24)
Device deselected (S High) and in standby mode
0
1. All the values are guaranteed by characterization, and not 100% tested in production.
2. See Table 15 for a description of the device status after a Reset Low pulse.
3. S remains Low while Reset is Low.
Figure 29. Reset AC waveforms
S
tSHRH
tRHSL
tRLRH
Reset
AI06808
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