®
Numonyx™ StrataFlash Embedded Memory (J3-65nm)
13.0
Maximum Ratings and Operating Conditions
13.1
Absolute Maximum Ratings
Warning:
Stressing the device beyond the “Absolute Maximum Ratings” may cause permanent
damage. These are stress ratings only.
NOTICE: This document contains information available at the time of its release. The specifications are subject to change without
notice. Verify with your local Numonyx sales office that you have the latest datasheet before finalizing a design.
Table 17: Absolute Maximum Ratings
Parameter
Min
Max
Unit
Notes
Temperature under Bias Expanded (T , Ambient)
A
–40
–65
–2.0
–2.0
—
+85
°C
°C
V
—
—
2
Storage Temperature
+125
V
& V
Voltage
+5.6
CC
CCQ
Voltage on any input/output signal (except VCC, VCCQ)
Output Short Circuit Current
V
(max) + 2.0
100
V
1
CCQ
I
mA
3
SH
Notes:
1.
Voltage is referenced to V . During infrequent non-periodic transitions, the voltage potential between V and input/
SS SS
output pins may undershoot to –2.0 V for periods < 20 ns or overshoot to V
(max) + 2.0 V for periods < 20 ns.
CCQ
2.
3.
During infrequent non-periodic transitions, the voltage potential between V and the supplies may undershoot to –2.0
CC
V for periods < 20 ns or V
(max) + 2.0 V for periods < 20 ns.
SUPPLY
Output shorted must be no more than one second. No more than one output can be shorted at a time.
13.2
Operating Conditions
Warning:
Operation beyond the “Operating Conditions” is not recommended and extended
exposure beyond the “Operating Conditions” may affect device reliability
Table 18: Temperature and VCC Operating Condition
Symbol
Parameter
Min
Max
Unit
Test Condition
T
Operating Temperature (Amibent)
-40
2.7
+85
3.6
3.6
—
°C
V
Ambient Temperature
A
V
V
V
Supply Voltage
—
—
—
CC
CC
I/O Supply Voltage
2.7
V
CCQ
Block Erase Cycles Main Blocks
100k
Cycles
Datasheet
38
December 2008
319942-02