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LM2419T 参数 Datasheet PDF下载

LM2419T图片预览
型号: LM2419T
PDF下载: 下载PDF文件 查看货源
内容描述: 三重65 MHz的CRT驱动器 [Triple 65 MHz CRT Driver]
分类和应用: 驱动器商用集成电路放大器局域网
文件页数/大小: 8 页 / 163 K
品牌: NSC [ National Semiconductor ]
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Absolute Maximum Ratings (Note 1)  
If Military/Aerospace specified devices are required,  
please contact the National Semiconductor Sales  
Office/Distributors for availability and specifications.  
Supply Voltage (Va  
)
85V  
25 C to 100 C  
a
b
a
Storage Temperature (T  
)
§
20 C to 90 C  
§
STG  
b
a
Operating Case Temperature, T  
§
§
Case  
k
Lead Temperature (soldering 10 sec.)  
ESD Tolerance  
300 C  
§
2 kV  
Electrical Characteristics  
Unless otherwise specified, the following specifications apply for Va  
80V, DC input bias, V  
e
25 C; see test circuit, Figure 1.  
e
3.9V; 50 V output  
PP  
IN DC  
e
e
e
e
12 pF; T  
A
swing; frequency  
1 MHz; V  
12V; C  
§
Bias  
L
Min  
Typ  
Max  
Units  
Symbol  
Parameter  
Conditions  
(Note 3)  
(Note 2)  
(Note 3)  
(Limit)  
I
I
Supply Current (per Amplifier)  
Bias Current (Pins 2 or 7 or 9)  
Output Offset Voltage  
Rise Time  
Input/Output Open Circuit  
27  
11  
50  
5
40  
60  
mA  
mA  
V
CC  
B
V
40  
OUT  
t
t
10% to 90%  
90% to 10%  
ns  
r
f
Fall Time  
5
ns  
b
b
b
18  
A
Voltage Gain  
13  
15  
V/V  
%
V
k
: t , t  
r f  
OS  
LE  
Overshoot  
V
V
2 ns  
8
IN  
e
Linearlty Error  
25V to 75V  
8
%
OUT  
DA match  
V
Gain Matching  
0.3  
dB  
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. The guaranteed specifications apply only for the test conditions  
listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions.  
Note 2: Typical specifications are at 25 C and represent the most likely parametric norm.  
§
Note 3: Min/Max limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).  
Typical Performance  
Characteristics  
e
T
A
25 C, Test CircuitÐFigure 1  
§
Frequency Response  
TL/H/11442–3  
*12 pF is the total load capacitance and includes the test fixture capaci-  
tance.  
FIGURE 1. Test Circuit (One Section)  
TL/H/11442–4  
2
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