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CF5006AHA-1 参数 Datasheet PDF下载

CF5006AHA-1图片预览
型号: CF5006AHA-1
PDF下载: 下载PDF文件 查看货源
内容描述: 晶体振荡器模块集成电路 [Crystal Oscillator Module ICs]
分类和应用: 振荡器晶体振荡器
文件页数/大小: 19 页 / 129 K
品牌: NPC [ NIPPON PRECISION CIRCUITS INC ]
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SM5006 series  
Electrical Characteristics  
5006×N series  
3V operation: V = 2.7 to 3.6 V, V = 0 V, Ta = 20 to 80 °C unless otherwise noted.  
DD  
SS  
Rating  
Parameter  
Symbol  
Condition  
Unit  
min  
2.2  
typ  
2.4  
0.3  
max  
HIGH-level output voltage  
LOW-level output voltage  
V
Q: Measurement cct 1, V = 2.7V, I = 8mA  
DD OH  
V
V
OH  
V
Q: Measurement cct 2, V = 2.7V, I = 8mA  
DD OL  
0.4  
10  
10  
OL  
V
V
= V  
= V  
OH  
DD  
Q: Measurement cct 2, INHN = LOW,  
= 5.5V  
Output leakage current  
I
ꢀA  
Z
V
DD  
OL  
SS  
HIGH-level input voltage  
LOW-level input voltage  
V
INHN  
INHN  
2.0  
V
V
IH  
V
0.5  
IL  
SM5006ANCS  
CF5006ANC  
SM5006BNCS  
CF5006BNC  
f = 30MHz  
8
16  
f = 30MHz,  
Ta = 10 to 70°C  
SM5006CNCS  
CF5006CNC  
8
16  
26  
SM5006ANDS  
CF5006AND  
f = 50MHz  
13  
INHN = open,  
Measurement cct 3,  
load cct 1,  
SM5006BNES  
CF5006BNE  
SM5006CNES  
CF5006CNE  
SM5006DNES  
CF5006DNE  
Current consumption  
I
mA  
DD  
f = 70MHz  
15  
30  
V = 3.0 to 3.6V,  
DD  
C = 15pF  
L
SM5006CNDS  
CF5006CND  
SM5006DNCS  
CF5006DNC  
f = 40MHz,  
Ta = 10 to 70°C  
11  
20  
22  
40  
SM5006ANES  
CF5006ANE  
SM5006ANFS  
CF5006ANF  
f = 70MHz  
INHN pull-up resistance  
R
Measurement cct 4  
Measurement cct 5  
50  
150  
9.43  
6.44  
kΩ  
kΩ  
UP  
SM5006ANAS, CF5006ANA  
SM5006ANBS, CF5006ANB  
6.97  
4.76  
8.2  
5.6  
SM5006ANCS, CF5006ANC  
SM5006CNCS, CF5006CNC  
4.16  
4.9  
5.64  
Feedback resistance  
R
f
SM5006ANDS, CF5006AND  
SM5006ANES, CF5006ANE  
SM5006ANFS, CF5006ANF  
SM5006CNDS, CF5006CND  
SM5006CNES, CF5006CNE  
2.21  
2.6  
2.99  
R
Design value, determined by the R value  
f
17  
17  
20  
20  
8
23  
23  
G
Built-in resistance  
Built-in capacitance  
R
Design value, determined by the R value  
f
D
C
Design value. A monitor pattern on a wafer is tested.  
Design value. A monitor pattern on a wafer is tested.  
7.44  
14.88  
8.56  
17.12  
G
pF  
C
16  
D
SEIKO NPC CORPORATION —7  
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