SM5006 series
5V operation: V = 4.5 to 5.5V, V = 0V, Ta = −40 to 85°C unless otherwise noted.
DD
SS
Rating
typ
Parameter
Symbol
Condition
Unit
min
max
HIGH-level output
voltage
V
Q: Measurement cct 1, V = 4.5V, I = 16mA
DD OH
4.0
4.2
–
V
V
OH
LOW-level output voltage
V
Q: Measurement cct 2, V = 4.5V, I = 16mA
DD OL
–
–
0.3
–
0.4
10
10
–
OL
V
V
= V
= V
OH
DD
Output leakage current
I
Q: Measurement cct 2, INHN = LOW, V = 5.5V
DD
ꢀA
Z
–
–
OL
SS
HIGH-level input voltage
LOW-level input voltage
V
INHN
INHN
2.0
–
–
V
V
IH
V
–
0.8
IL
SM5006ANAS
CF5006ANA
f = 30MHz
–
18
35
SM5006ANBS
CF5006ANB
f = 40MHz
–
–
–
20
30
30
40
60
50
INHN = open,
Measurement cct 3,
load cct 1,
f = 60MHz
CF5006ANC
f = 60MHz,
Ta = –20 to 80°C
SM5006ANCS
V = 4.5 to 5.5V,
DD
C = 50pF
L
CF5006AND
CF5006BNC
f = 70MHz
–
–
–
–
–
–
–
–
40
40
28
28
35
35
45
45
80
70
50
50
65
65
80
80
f = 70MHz,
Ta = –20 to 80°C
SM5006ANDS
SM5006BNCS
f = 60MHz, C = 15pF,
L
Ta = –15 to 75°C
CF5006CNC
f = 60MHz, C = 15pF,
L
Ta = 0 to 70°C
SM5006CNCS
Current consumption
I
mA
DD
f = 70MHz, C = 15pF,
L
Ta = –15 to 75°C
CF5006CND
CF5006DNC
f = 70MHz, C = 15pF,
L
Ta = 0 to 70°C
SM5006CNDS
SM5006DNCS
INHN = open,
Measurement cct 3,
load cct 1,
f = 100MHz, C = 15pF,
L
Ta = –20 to 80°C
CF5006CNE
CF5006DNE
V
= 4.5 to 5.5V
f = 100MHz, C = 15pF,
L
Ta = 0 to 70°C
SM5006CNES
SM5006DNES
DD
f = 100MHz, C = 30pF
L
CF5006ANE
–
–
50
45
100
90
f = 100MHz, C = 15pF
L
SM5006ANES
f = 107MHz, C = 30pF,
L
Ta = –20 to 80 °C
CF5006ANF
CF5006BNE
–
–
60
50
100
90
f = 107MHz, C = 15pF,
L
Ta = –20 to 80°C
SM5006ANFS
SM5006BNES
INHN pull-up resistance
Feedback resistance
R
Measurement cct 4
Measurement cct 5
50
–
150
9.43
6.44
kΩ
kΩ
UP
SM5006ANAS, CF5006ANA
SM5006ANBS, CF5006ANB
6.97
4.76
8.2
5.6
SM5006ANCS, CF5006ANC
SM5006CNCS, CF5006CNC
4.16
4.9
5.64
R
f
SM5006ANDS, CF5006AND
SM5006ANES, CF5006ANE
SM5006ANFS, CF5006ANF
SM5006CNDS, CF5006CND
SM5006CNES, CF5006CNE
2.21
2.6
2.99
R
Design value, determined by the R value
f
17
17
20
20
8
23
23
G
Built-in resistance
Built-in capacitance
Ω
R
Design value, determined by the R value
f
D
C
Design value. A monitor pattern on a wafer is tested.
Design value. A monitor pattern on a wafer is tested.
7.44
14.88
8.56
17.12
G
pF
C
16
D
SEIKO NPC CORPORATION —8
NPC [ NIPPON PRECISION CIRCUITS INC ]
