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MU9C4320L-70TDI 参数 Datasheet PDF下载

MU9C4320L-70TDI图片预览
型号: MU9C4320L-70TDI
PDF下载: 下载PDF文件 查看货源
内容描述: 4K ×32的内容可寻址存储器(CAM )具有32位宽的数据接口 [4K x 32 Content Addressable Memory (CAM) with a 32-bit wide data interface]
分类和应用: 存储内存集成电路静态存储器双倍数据速率
文件页数/大小: 32 页 / 449 K
品牌: MUSIC [ MUSIC SEMICONDUCTORS ]
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MU9C4320L ATMCAM  
Pin Descriptions  
/FF (Full Flag, Output)  
/MV (Match Valid, Output)  
The /FF output indicates when all the memory locations  
have their Validity bits set valid (LOW). When there is at  
least one location with its Validity bit set HIGH, the /FF  
output will be HIGH; when all locations have their  
Validity bits set LOW, and the /FI input is LOW, the /FF  
output will be LOW. If the /FI input is HIGH, the /FF  
output will be HIGH. The state of the /FF line will not  
change until after the rising edge of /E during a Write  
cycle.  
After a Compare cycle, the /MV line indicates whether  
there has been a valid match in this device in either the  
CAM array or the VP Table. When /MV is LOW then a  
match has occurred in either the CAM array or the VP  
Table; when /MV is HIGH then a mismatch has occurred  
in both the CAM array and the VP Table. The /MF output  
is used to distinguish between the two types of matches.  
The state of the /MV line will not change until after the  
rising edge of /E during a Comparison cycle. /MV  
represents local conditions written in the device; it is not  
conditioned by the /MI input.  
/FI (Full Input, Input)  
The /FI input receives full information from the next  
higher-priority ATMCAM in a vertically cascaded system  
to provide system-level full information. When the /FI  
input is LOW the /FF output will be HIGH if there is at  
least one location whose Validity bit is set invalid; when  
all locations have their Validity bits set valid, the /FF  
output goes LOW. When the /FI input is HIGH, the /FF  
output will remain HIGH. The /FF output from one device  
is connected to the /FI input of the next lower-priority  
device to give system-full indication. The /FI pin of the  
highest-priority device must be tied LOW.  
/RESET  
The /RESET input is used to reset the ATMCAM to a  
known state. When the /RESET line is pulled LOW it  
causes the ATMCAM to enter its reset state. After power  
is applied to the ATMCAM, the /RESET line must be held  
LOW for a time equal to or greater than the minimum  
RESET pulse width before the device can operate  
correctly.  
TCLK (JTAG Test Clock, Input)  
The TCLK input is the Test Clock input.  
/MM (Multiple Match, Open Drain Output)  
TMS (JTAG Test Mode Select, Input)  
The /MM line indicates that there is a multiple match  
within the system. When the /MI input is HIGH, the /MM  
line is pulled LOW if there are at least two matches within  
the ATMCAM as a result of the previous Comparison  
cycle; when there are less than two matches, the /MM line  
floats HIGH. When the /MI input is LOW, the /MM line is  
pulled LOW if there are one or more matches within the  
ATMCAM as a result of the previous Comparison cycle;  
when there are no matches, the /MM line floats HIGH.  
The /MM lines have open-drain outputs, so all /MM lines  
within the system are connected together to give  
system-level multiple match indication. The state of the  
/MM line will not change until after the rising edge of /E  
during a Comparison cycle. The /MM line is unaffected by  
matches in the VP Table.  
The TMS input is the Test Mode Select input.  
TDI (JTAG Test Data Input, Input)  
The TDI input is the Test Data input.  
TDO (JTAG Test Data Output, Output)  
The TCLK output is the Test Data output.  
/TRST (JTAG Reset, Input)  
The /TRST input is the Reset input, and serves to reset the  
Test Access Port circuitry to its reset condition.  
VDD, GND (Positive Power Supply, Ground)  
These pins are the main power supply connections to the  
ATMCAM. VDD must be held at +3.3 Volt ± 0.3 Volt  
relative to the GND pin, which is at 0 Volt, system  
reference potential, for correct operation of the device.  
Note: The TCLK, TMS, TDI, TDO, and /TRST lines are defined  
in the IEEE Standard Test Access Port and Boundary-scan  
Architecture IEEE Std. 1149.1-1990 and IEEE Std.  
1149.1a-1993.  
6
Rev. 3  
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