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GRT31CR60J476KE13 参数 Datasheet PDF下载

GRT31CR60J476KE13图片预览
型号: GRT31CR60J476KE13
PDF下载: 下载PDF文件 查看货源
内容描述: [AEC-Q200 Compliant Chip Multilayer Ceramic Capacitors for Infotainment]
分类和应用:
文件页数/大小: 30 页 / 848 K
品牌: MURATA [ muRata ]
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AEC-Q200 Murata Standard Specification and Test Methods  
No  
AEC-Q200 Test Item  
Specifications.  
AEC-Q200 Test Method  
17 Board Flex  
Appearance  
Capacitance  
No marking defects  
Solder the capacitor on the test substrate(glass epoxy board)  
shown in Fig1.  
Within the specified initial value.  
Within the specified initial value.  
Within the specified initial value.  
Then apply a force in the direction shown in Fig 2 for 60 seconds.  
The soldering should be done by the reflow method and should be  
conducted with care so that the soldering is uniform and free of defects  
such as heat shock.  
D.F.  
Series  
GRT03  
GRT15  
GRT18  
GRT21  
GRT31  
GRT32  
a
b
c
0.3  
0.5  
0.6  
0.8  
2.0  
2.0  
0.9  
1.5  
2.2  
3.0  
4.4  
4.4  
0.3  
0.6  
0.9  
1.3  
1.7  
2.6  
Insulation  
Resistance  
25℃  
(in mm)  
Pressurization  
50 min.  
speed  
1.0mm/s  
20  
b
Land  
f4.5  
Pressurize  
R4  
a
Flexure2  
(Chip thickness0.85mm rank  
High Dielectric Type)  
Flexure1  
(Chip thickness0.85mm rank  
High Dielectric Type)  
100  
Capacitance meter  
45 45  
t : 1.6mm  
(GRT03,15:0.8mm)  
Fig.1  
ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀFig.2  
18 Terminal  
Strength  
Appearance  
Capacitance  
No marking defects  
Solder the capacitor on the test substrate(glass epoxy board)  
shown in Fig3.  
Then apply 18N* force in parallel with the test jig for 60 seconds.  
The soldering should be done either with an iron or using the reflow  
Within the specified initial value.  
Within the specified initial value.  
Within the specified initial value.  
method and should be conducted with care so that the soldering is  
uniform and free of defects such as heat shock  
*2N(GRT03,15)  
D.F.  
Series  
GRT03  
GRT15  
GRT18  
GRT21  
GRT31  
GRT32  
a
b
c
0.3  
0.4  
1.0  
1.2  
2.2  
2.2  
0.9  
1.5  
3.0  
4.0  
5.0  
5.0  
0.3  
0.5  
1.2  
1.65  
2.0  
2.9  
Insulation  
Resistance  
25℃  
in mm)  
c
t : 1.6mm  
(GRT03,15:0.8mm)  
Solder resist  
Baked electrode  
or copper foil  
Fig.3  
19 Beam Load Test  
Destruction value should be exceed following one.  
< Chip L dimension : 2.5mm max. >  
Chip thickness > 0.5mm rank : 20N  
Chip thickness = 0.5mm rank : 8N  
Place the capacitor in the beam load fixture as Fig 4.  
Apply a force.  
< Chip Length : 2.5mm max. >  
Chip thickness = 0.3mm rank : 5N  
Iron Board  
Chip thickness < 0.3mm rank : 2.5N  
< Chip L dimension : 3.2mm min. >  
Chip thickness < 1.25mm rank : 15N  
ꢀꢀChip thickness 1.25mm rank : 54.5N  
< Chip Length : 3.2mm min. >  
L
0.6L  
Fig.4  
Speed supplied the Stress Load : *0.5mm/s  
*GRT03 : 0.1mm/s  
JEMCGS-01744N  
5
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