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GRT31CR60J476KE13 参数 Datasheet PDF下载

GRT31CR60J476KE13图片预览
型号: GRT31CR60J476KE13
PDF下载: 下载PDF文件 查看货源
内容描述: [AEC-Q200 Compliant Chip Multilayer Ceramic Capacitors for Infotainment]
分类和应用:
文件页数/大小: 30 页 / 848 K
品牌: MURATA [ muRata ]
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AEC-Q200 Murata Standard Specification and Test Methods  
No  
1
AEC-Q200 Test Item  
Specifications.  
AEC-Q200 Test Method  
Pre-and Post-Stress  
-
Electrical Test  
2
High Temperature  
Exposure (Storage)  
The measured and observed characteristics should satisfy the  
specifications in the following table.  
No marking defects  
Solder the capacitor on the test substrate(glass epoxy board).  
Set the capacitor for 1000+/-12 hours at maximum operating  
Appearance  
temperature +/-3.  
Set for 24+/-2 hours at room temperature, then measure.  
Capacitance  
Change  
Within +/-12.5%  
Initial measurement  
Perform a heat treatment at 150+0/-10 for 1hour and then sit  
for 24+/-2 hours at room temperature. Perform the initial measurement.  
0.2 max.  
D.F.  
Insulation  
More than 500MΩ or 25Ω F (Whichever is smaller)  
Resistance  
25℃  
3
Temperature Cycling  
The measured and observed characteristics should satisfy the  
specifications in the following table.  
No marking defects  
Solder the capacitor on the test substrate(glass epoxy board).  
Perform the 1000 cycles test according to the four heat treatments  
Appearance  
in the following table.  
Set for 24+/-2 hours at room temperature, then measure.  
Capacitance  
Change  
Within +/-7.5%  
0.2 max.  
Step  
1
2
3
4
Temp.  
Room  
Temp.  
Room  
Temp.  
Min.Operating Temp.+0/-3  
Max.Operating Temp. +3/-0  
(C)  
D.F.  
Time  
(min)  
15+/-3  
1
15+/-3  
1
Initial measurement  
Insulation  
Within the specified initial value.  
No defects or abnormalities  
Perform a heat treatment at 150+0/-10 for 1hour and then sit  
Resistance  
for 24+/-2 hours at room temperature. Perform the initial measurement.  
25℃  
4
5
Destructive  
Per EIA-469  
Physical Analysis  
Biased Humidity  
The measured and observed characteristics should satisfy the  
specifications in the following table.  
No marking defects  
Solder the capacitor on the test substrate(glass epoxy board).  
Apply the rated voltage and 1.3+0.2/-0Vdc (add 6.8kΩ resister)  
Appearance  
at 85+/-3and 80%RH to 85%RH humidity for 1000+/-12 hours.  
The charge/discharge current is less than 50mA.  
Capacitance  
Change  
Within +/-12.5%  
Initial measurement  
Perform a heat treatment at 150+0/-10 for 1hour and then sit  
for 24+/-2 hours at room temperature. Perform the initial measurement.  
0.2 max.  
D.F.  
Measurement after test  
Insulation  
More than 100MΩ or 5Ω F (Whichever is smaller)  
Perform a heat treatment at 150+0/-10 for 1hour and then sit  
Resistance  
for 24+/-2 hours at room temperature. Perform the initial measurement.  
25℃  
JEMCGS-01744N  
2
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