■AEC-Q200 Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
Specification.
AEC-Q200 Test Method
Pre-and Post-Stress
Electrical Test
1
2
-
High Temperature
Exposure (Storage)
The measured and observed characteristics should satisfy Solder the capacitor on the test substrate(glass epoxy board).
the specifications in the following table.
Set the capacitor for 1000+/-12h at 150+/-3℃.
Appearance No marking defects
Set for 24+/-2h at room temperature, then measure.
・ Initial measurement
Capacitance Within +/-10.0%
Change
Perform a heat treatment at 150+0/-10 ℃for 1h and then sit
for 24+/-2h at room temperature.Perform the initial measurement.
D.F.
0.03 max.
I.R.
Within the specified initial value.
25℃
3
Temperature Cycling
The measured and observed characteristics should satisfy
the specifications in the following table.
Solder the capacitor on the test substrate(glass epoxy board).
Perform the 1000 cycles test according to the four heat treatments
listed in the following table.
Appearance No marking defects
Set for 24+/-2h at room temperature, then measure.
Step
1
2
3
4
Capacitance Within +/-10.0%
Change
Temp.
Room
Temp.
Room
Temp.
Min.Operating Temp.+0/-3
Max.Operating Temp. +3/-0
(C)
Time
(min)
15+/-3
1
15+/-3
1
D.F.
0.03 max.
・ Initial measurement
Perform a heat treatment at 150+0/-10 ℃for 1h and then sit
I.R.
Within the specified initial value.
No defects or abnormalities
for 24+/-2h at room temperature.Perform the initial measurement.
25℃
4
5
Destructive
Per EIA-469.
Physical Analysis
Moisture Resistance
The measured and observed characteristics should satisfy
the specifications in the following table.
Solder the capacitor on the test substrate(glass epoxy board).
Apply the 24h heat (25℃ to 65℃) and humidity (80%RH to 98%RH)
treatment shown below, 10 consecutive times.
Appearance No marking defects
Set for 24+/-2h at room temperature, then measure.
Humidity
80～98%
Humidity
80～98%
Temperature
Humidity
90～98%
Humidity
90～98%
Humidity
90～98%
Capacitance Within +/-12.5%
Change
(℃)
70
65
60
55
50
45
40
35
30
25
20
15
10
5
D.F.
0.03 max.
I.R.
Within the specified initial value.
+10
- 2 ℃
25℃
Initial measuremt
0
-5
-10
One cycle 24hours
0
1
2
3
4
5
6
7
8
9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
Hours
・ Initial measurement
Perform a heat treatment at 150+0/-10 ℃for 1h and then sit
for 24+/-2h at room temperature.Perform the initial measurement.
6
The measured and observed characteristics should satisfy
the specifications in the following table.
Biased Humidity
Solder the capacitor on the test substrate(glass epoxy board).
Apply the rated voltage and 1.3+0.2/-0Vdc (add 6.8kΩ resister)
at 85+/-3℃ and 80%RH to 85%RH humidity for 1000+/-12h.
The charge/discharge current is less than 50mA.
Appearance No marking defects
Remove and set for 24+/-2h at room temperature, then measure.
Capacitance Within +/-12.5%
Change
・ Initial measurement
D.F.
0.035 max.
Perform a heat treatment at 150+0/-10 ℃for 1h and then sit
for 24+/-2h at room temperature.Perform the initial measurement.
I.R.
More than 1,000MΩ or 50Ω・F
25℃
(Whichever is smaller)
JEMCGS-00806D
2
MURATA [ muRata ]
