Freescale Semiconductor, Inc.
Micromachined Accelerometer Reliability Testing Results
LIFE AND ENVIRONMENTAL TESTING RESULTS
RESULTS
FAILED/PASS
STRESS TEST
High Temperature Bias
CONDITIONS
T = 90°C, V
DD
= 5.0 V
0/32
A
t = 1000 hours, 12 minutes on, 8 seconds off
High Temperature/High Humidity Bias
T = 85°C, R = 85%,
0/38
A
H
V
= 5.0 V, t = 2016
DD
High Temperature Storage (Bake)
Temperature Cycle
T = 105°C, t = 1000 hours
0/35
0/23
A
40 to 105°C, Air to Air,
15 minutes at extremes,
5 minutes transfer, 1000 cycles
Mechanical Shock
5 blows X1, X2, Y1, Y2, Z1, Z2
0/12
0/12
2.0 G’s, 0.5 mS, T = 40°C, 25°C, 90°C
A
Vibration Variable Frequency
with Temperature Cycle
10 – 1 Khz @ 50 G’s max,
24 hours each axis,
X1, X2, Y1, Y2, Z1, Z2, T = 40 to 90°C,
A
Dwell = 1 Hour, transfer = 65 minutes
Autoclave
Drop Test
T = 121°C, R = 100%
0/71
0/12
A
H
15 P
, t = 240 hours
SIG
10 Drops from 1.0 meters onto concrete,
any orientation
PARAMETERS MONITORED
LIMITS
INITIAL
END POINTS
PARAMETER
Offset
CONDITIONS
= 5.0 V, 25,
MIN
MAX
MIN
MAX
V
V
V
2.15 V
2.95 V
2.15 V
2.95V
DD
40 & 90°C
Self Test
= 5.0 V, 25,
40 & 90°C
20G
30 G
20 G
30 G
DD
Sensitivity
= 5.0 V, 25,
40 & 90°C
45 mV/G
55 mV/G
45 mV/G
55 mV/G
DD
Motorola Sensor Device Data
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