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MMA1250D 参数 Datasheet PDF下载

MMA1250D图片预览
型号: MMA1250D
PDF下载: 下载PDF文件 查看货源
内容描述: 传感器 [Sensor]
分类和应用: 传感器
文件页数/大小: 670 页 / 6314 K
品牌: MOTOROLA [ MOTOROLA ]
 浏览型号MMA1250D的Datasheet PDF文件第17页浏览型号MMA1250D的Datasheet PDF文件第18页浏览型号MMA1250D的Datasheet PDF文件第19页浏览型号MMA1250D的Datasheet PDF文件第20页浏览型号MMA1250D的Datasheet PDF文件第22页浏览型号MMA1250D的Datasheet PDF文件第23页浏览型号MMA1250D的Datasheet PDF文件第24页浏览型号MMA1250D的Datasheet PDF文件第25页  
Freescale Semiconductor, Inc.  
154  
153  
152  
151  
UCL = 152.8  
= 150.4  
X
150  
149  
LCL = 148.0  
148  
147  
UCL = 7.3  
7
6
5
4
= 3.2  
R
3
2
1
0
LCL = 0  
Figure 4. Example of Process Control Chart Showing Oven Temperature Data  
Where D4, D3 and A2 are constants varying by sample  
size,with values for sample sizes from 2 to 10 shown in the  
following partial table:  
Since:  
tot  
tot  
2
2
2
2
2
A
2
B
C
D
E
n
2
3
4
5
6
7
8
9
10  
3.27 2.57 2.28 2.11 2.00 1.92 1.86 1.82 1.78  
0.08 0.14 0.18 0.22  
1.88 1.02 0.73 0.58 0.48 0.42 0.37 0.34 0.31  
2
2
2
2
(
)
5
3
2
1
0.4  
6.3  
D
4
3
2
Now if only D is identified and eliminated then;  
D
A
*
*
*
*
*
2
2
2
2
(
)
tot  
5
3
2
0.4  
6.2  
This results in less than 2% total variability improvement.  
If B, C and D were eliminated, then;  
* For sample sizes below 7, the LCL would technically be  
R
a negative number; in those cases there is no lower control  
limit; this means that for a subgroup size 6, six “identical”  
measurements would not be unreasonable.  
Control charts are used to monitor the variability of critical  
process parameters. The R chart shows basic problems with  
piece to piece variability related to the process. The X chart  
can often identify changes in people, machines, methods,  
etc. The source of the variability can be difficult to find and  
may require experimental design techniques to identify  
assignable causes.  
Some general rules have been established to help deter-  
mine when a process is OUT-OF-CONTROL. Figure 5 shows  
a control chart subdivided into zones A, B, and C corre-  
sponding to 3 sigma, 2 sigma, and 1 sigma limits respectively.  
In Figure 6 through Figure 9 four of the tests that can be used  
toidentifyexcessivevariabilityandthepresenceofassignable  
causes are shown. As familiarity with a given process  
increases, more subtle tests may be employed successfully.  
Once the variability is identified, the cause of the variability  
mustbedetermined. Normally,onlyafewfactorshaveasignif-  
icant impact on the total variability of the process. The impor-  
tance of correctly identifying these factors is stressed in the  
following example. Suppose a process variability depends on  
the variance of five factors A, B, C, D and E. Each has a vari-  
ance of 5, 3, 2, 1 and 0.4 respectively.  
2
2
(
)
tot  
5
0.4  
5.02  
This gives a considerably better improvement of 23%. If  
only A is identified and reduced from 5 to 2, then;  
2
2
2
2
2
(
)
tot  
2
3
2
1
0.4  
4.3  
Identifying and improving the variability from 5 to 2 gives  
us a total variability improvement of nearly 40%.  
Most techniques may be employed to identify the primary  
assignable cause(s). Out-of-control conditions may be  
correlated to documented process changes. The product  
may be analyzed in detail using best versus worst part  
comparisons or Product Analysis Lab equipment. Multi-vari-  
ance analysis can be used to determine the family of varia-  
tion (positional, critical or temporal). Lastly, experiments may  
be run to test theoretical or factorial analysis. Whatever  
method is used, assignable causes must be identified and  
eliminated in the most expeditious manner possible.  
After assignable causes have been eliminated, new  
control limits are calculated to provide a more challenging  
variability criteria for the process. As yields and variability  
improve, it may become more difficult to detect improve-  
ments because they become much smaller. When all  
assignable causes have been eliminated and the points  
remain within control limits for 25 groups, the process is said  
to be in a state of control.  
Motorola Sensor Device Data  
www.motorola.com/semiconductors  
1–15  
For More Information On This Product,  
Go to: www.freescale.com  
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