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PC28F128G18FF 参数 Datasheet PDF下载

PC28F128G18FF图片预览
型号: PC28F128G18FF
PDF下载: 下载PDF文件 查看货源
内容描述: 128MB, 256MB,512MB ,1GB的StrataFlash存储器 [128Mb, 256Mb, 512Mb, 1Gb StrataFlash Memory]
分类和应用: 存储
文件页数/大小: 118 页 / 1154 K
品牌: MICRON [ MICRON TECHNOLOGY ]
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128Mb, 256Mb, 512Mb, 1Gb StrataFlash Memory  
Features  
Micron StrataFlash Embedded Memory  
P/N – PC28F128G18xx  
P/N – PC28F256G18xx  
P/N – PC28F512G18xx  
P/N – PC28F00AG18xx  
• Power  
– Core voltage: 1.7 V - 2.0 V  
– I/O voltage: 1.7 V - 2.0 V  
– Standby current: 60 μA (typ) for 512-Mbit, 65 nm  
– Deep Power-Down mode: 2 μA (typ)  
– Automatic Power Savings mode  
– 16-word synchronous-burst read current: 23 mA  
(typ) @ 108 MHz; 24 mA (typ) @ 133 MHz  
• Software  
Features  
• High-Performance Read, Program and Erase  
– 96 ns initial read access  
– 108 MHz with zero wait-state synchronous burst  
reads: 7 ns clock-to-data output  
– 133 MHz with zero wait-state synchronous burst  
reads: 5.5 ns clock-to-data output  
– 8-, 16-, and continuous-word synchronous-burst  
Reads  
– Programmable WAIT configuration  
– Customer-configurable output driver impedance  
– Buffered Programming: 2.0 μs/Word (typ), 512-  
Mbit 65 nm  
– Micron® Flash data integrator (FDI) optimized  
– Basic command set (BCS) and extended com-  
mand set (ECS) compatible  
– Common Flash interface (CFI) capable  
• Security  
– Block Erase: 0.9 s per block (typ)  
20 μs (typ) program/erase suspend  
• Architecture  
– 16-bit wide data bus  
– Multi-Level Cell Technology  
– One-time programmable (OTP) space  
64 unique factory device identifier bits  
2112 user-programmable OTP bits  
– Absolute write protection: VPP = GND  
– Power-transition erase/program lockout  
– Individual zero latency block locking  
– Individual block lock-down  
– Symmetrically-Blocked Array Architecture  
– 256-Kbyte Erase Blocks  
– 1-Gbit device: Eight 128-Mbit partitions  
– 512-Mbit device: Eight 64-Mbit partitions  
– 256-Mbit device: Eight 32-Mbit partitions  
– 128-Mbit device: Eight 16-Mbit partitions  
– Read-While-Program and Read-While-Erase  
– Status Register for partition/device status  
– Blank Check feature  
• Density and packaging  
– 128Mb, 256Mb, 512Mbit, and 1-Gbit  
– Address-data multiplexed and non-multiplexed  
interfaces  
– 64-Ball Easy BGA  
• Quality and Reliability  
– Expanded temperature: –30 °C to +85 °C  
– Minimum 100,000 erase cycles per block  
– 65nm Process Technology  
PDF: 09005aef8448483a  
128_256_512_65nm_g18.pdf - Rev. F 8/11 EN  
Micron Technology, Inc. reserves the right to change products or specifications without notice.  
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© 2011 Micron Technology, Inc. All rights reserved.  
Products and specifications discussed herein are subject to change by Micron without notice.